scholarly journals Charge Carrier Lifetime Fluctuations and Performance Evaluation of Cu(In,Ga)Se 2 Absorbers via Time‐Resolved‐Photoluminescence Microscopy

2021 ◽  
pp. 2102800
Author(s):  
Mario Ochoa ◽  
Shih‐Chi Yang ◽  
Shiro Nishiwaki ◽  
Ayodhya N. Tiwari ◽  
Romain Carron
2011 ◽  
Vol 110 (5) ◽  
pp. 054508 ◽  
Author(s):  
David Kiliani ◽  
Gabriel Micard ◽  
Benjamin Steuer ◽  
Bernd Raabe ◽  
Axel Herguth ◽  
...  

2021 ◽  
Author(s):  
Rajiv Ramanujam Prabhakar ◽  
Thomas Moehl ◽  
Dennis Friedrich ◽  
Marinus Kunst ◽  
Sudhanshu Shukla ◽  
...  

<p>Sb<sub>2</sub>Se<sub>3 </sub>has emerged as an important photoelectrochemical (PEC) and photovoltaic (PV) material due to its rapid rise in photoconversion efficiencies. However, despite its binary nature, Sb<sub>2</sub>Se<sub>3 </sub>has a complex defect chemistry, which reduces the maximum photovoltage that can be obtained. Thus, it is important to understand these defects and to develop passivation strategies in order to further improve this material. In this work, a comprehensive investigation of the charge carrier dynamics of Sb<sub>2</sub>Se<sub>3</sub> and the influence of sulfur treatment on its optoelectronic properties was performed using time resolved microwave conductivity (TRMC), photoluminescence (PL) spectroscopy and low frequency Raman spectroscopy (LFRS). The key finding in this work is that upon sulfur treatment of Sb<sub>2</sub>Se<sub>3</sub>, the carrier lifetime is increased by the passivation of deep defects in Sb<sub>2</sub>Se<sub>3</sub> in both the surface region and the bulk, which is evidenced by increased charge carrier lifetime of TRMC decay dynamics, increased radiative recombination efficiency and decreased deep defect level emission (PL), and improved long-range order in the material (LFRS). These findings provide crucial insights into the defect passivation mechanisms in Sb<sub>2</sub>Se<sub>3</sub> paving the way for developing highly efficient PEC and PV devices.</p>


2018 ◽  
Vol 9 (38) ◽  
pp. 7546-7555 ◽  
Author(s):  
Robert Godin ◽  
Takashi Hisatomi ◽  
Kazunari Domen ◽  
James R. Durrant

Time-resolved spectroscopies reveals remarkably long charge carrier lifetime in GaN:ZnO solid solution leading to hole accumulation key to water oxidation.


2021 ◽  
Author(s):  
Rajiv Ramanujam Prabhakar ◽  
Thomas Moehl ◽  
Dennis Friedrich ◽  
Marinus Kunst ◽  
Sudhanshu Shukla ◽  
...  

<p>Sb<sub>2</sub>Se<sub>3 </sub>has emerged as an important photoelectrochemical (PEC) and photovoltaic (PV) material due to its rapid rise in photoconversion efficiencies. However, despite its binary nature, Sb<sub>2</sub>Se<sub>3 </sub>has a complex defect chemistry, which reduces the maximum photovoltage that can be obtained. Thus, it is important to understand these defects and to develop passivation strategies in order to further improve this material. In this work, a comprehensive investigation of the charge carrier dynamics of Sb<sub>2</sub>Se<sub>3</sub> and the influence of sulfur treatment on its optoelectronic properties was performed using time resolved microwave conductivity (TRMC), photoluminescence (PL) spectroscopy and low frequency Raman spectroscopy (LFRS). The key finding in this work is that upon sulfur treatment of Sb<sub>2</sub>Se<sub>3</sub>, the carrier lifetime is increased by the passivation of deep defects in Sb<sub>2</sub>Se<sub>3</sub> in both the surface region and the bulk, which is evidenced by increased charge carrier lifetime of TRMC decay dynamics, increased radiative recombination efficiency and decreased deep defect level emission (PL), and improved long-range order in the material (LFRS). These findings provide crucial insights into the defect passivation mechanisms in Sb<sub>2</sub>Se<sub>3</sub> paving the way for developing highly efficient PEC and PV devices.</p>


2016 ◽  
Vol 858 ◽  
pp. 125-128
Author(s):  
Robin Karhu ◽  
Ian Booker ◽  
Ivan G. Ivanov ◽  
Erik Janzén ◽  
Jawad ul Hassan

Over 150 μm thick epilayers of 4H-SiC with long carrier lifetime have been grown with a chlorinated growth process. The carrier lifetime have been determined by time resolved photoluminescence (TRPL), the lifetime varies a lot between different areas of the sample. This study investigates the origins of lifetime variations in different regions using deep level transient spectroscopy (DLTS), low temperature photoluminescence (LTPL) and a combination of KOH etching and optical microscopy. From optical microscope images it is shown that the area with the shortest carrier lifetime corresponds to an area with high density of structural defects.


Solar RRL ◽  
2021 ◽  
Author(s):  
Bernd Steinhauser ◽  
Tim Niewelt ◽  
Armin Richter ◽  
Rebekka Eberle ◽  
Martin Schubert

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