Second‐Order Autocorrelation Function of Spectrally Filtered Light From an Incoherently Pumped Two‐Level System

2022 ◽  
pp. 2100286
Author(s):  
Ivan V. Panyukov ◽  
Vladislav Yu. Shishkov ◽  
Evgeny S. Andrianov
Keyword(s):  
Autocorrelation Function ◽  
Second Order ◽  
Level System

scholarly journals Simplified Machine Diagnosis Techniques with Absolute Deterioration Factor by Utilizing the Second Order Autocorrelation Function

2019 ◽  
Vol 8 (1) ◽  
pp. 1
Author(s):  
Kazuhiro Takeyasu
Keyword(s):  
Autocorrelation Function ◽  
Calculation Method ◽  
Second Order ◽  
Early Failure ◽  
Rolling Elements ◽  
Simplified Calculation ◽  
Simplified Calculation Method

Among many amplitude parameters, Kurtosis and Bicoherence are recognized to be the sensitive good parameters for machine diagnosis. In this paper, simplified calculation method of coefficient of autocorrelation function of 1st order lag is introduced, and new deterioration factor of correlation of four variables is introduced consecutively. New deterioration factor is an absolute index of deterioration factor. Three cases in which the rolling elements number is nine, twelve and sixteen are examined and compared. Varying N, the number of data, its characteristics are examined. When N is smaller, sensitivity is better. Therefore this parameter can be used as an index for the machine diagnosis of early failure stage especially.

scholarly journals Autocorrelation functions: a useful tool for both state and detector characterisation

2019 ◽  
Vol 6 (1) ◽  
pp. 1-6 ◽  
Author(s):  
Giovanni Chesi ◽  
Alessia Allevi ◽  
Maria Bondani
Keyword(s):  
Autocorrelation Function ◽  
Second Order ◽  
Quantum States ◽  
Statistical Properties ◽  
Silicon Photomultiplier ◽  
Autocorrelation Functions ◽  
Twin Beam ◽  
Multi Mode

Abstract The calculation of autocorrelation functions represents a routinely used tool to characterise quantum states of light. In this paper, we evaluate the g(2) function for detected photons in the case of mesoscopic multi-mode twin-beam states in order to fully investigate their statistical properties starting from measurable quantities. Moreover, we show that the second-order autocorrelation function is also useful to estimate the spurious effects affecting the employed Silicon-photomultiplier detectors.

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