ChemInform Abstract: Low Energy Ion Scattering and Secondary Ion Mass Spectrometry

10.1002/chin.201250276 ◽

2012 ◽

Vol 43 (50) ◽

pp. no-no

Author(s):

Norbert Kruse ◽

Sergey Chenakin

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Low Energy Ion Scattering ◽

Ion Mass Spectrometry ◽

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Low Energy Ion Scattering and Secondary Ion Mass Spectrometry

Characterization of Solid Materials and Heterogeneous Catalysts ◽

10.1002/9783527645329.ch11 ◽

2012 ◽

pp. 453-510 ◽

Author(s):

Norbert Kruse ◽

Sergey Chenakin

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Low Energy Ion Scattering ◽

Ion Mass Spectrometry ◽

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New perspectives in the surface analysis of energy materials by combined time-of-flight secondary ion mass spectrometry (ToF-SIMS) and high sensitivity low-energy ion scattering (HS-LEIS)

Journal of Analytical Atomic Spectrometry ◽

10.1039/c3ja50292a ◽

2014 ◽

Vol 29 (8) ◽

pp. 1361 ◽

Author(s):

Helena Téllez ◽

Ainara Aguadero ◽

John Druce ◽

Mónica Burriel ◽

Sarah Fearn ◽

...

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Secondary Ion Mass Spectrometry ◽

High Sensitivity ◽

Ion Scattering ◽

Energy Materials ◽

Tof Sims ◽

Low Energy Ion Scattering ◽

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Analysis of SnNi Electroplate by Secondary Ion Mass Spectrometry, Ion Scattering Spectrometry, and Rutherford Backscattering

Journal of The Electrochemical Society ◽

10.1149/1.2131652 ◽

1978 ◽

Vol 125 (8) ◽

pp. 1215-1218 ◽

Author(s):

Rudolf Schubert

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Rutherford Backscattering ◽

Ion Scattering ◽

Ion Mass Spectrometry ◽

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SURFACE ANALYSIS OF POLYSTYRENE LATEXES BY ION SCATTERING SPECTROSCOPY AND SECONDARY ION MASS SPECTROMETRY

Journal of Dispersion Science and Technology ◽

10.1080/01932698108943913 ◽

1981 ◽

Vol 2 (2-3) ◽

pp. 267-280 ◽

Author(s):

Charles C. Fifield ◽

Robert M. Fitch

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

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Characterization of S-glass/polysulfone adhesive failure using ion scattering spectroscopy and secondary ion mass spectrometry

Journal of Colloid and Interface Science ◽

10.1016/0021-9797(80)90178-2 ◽

1980 ◽

Vol 74 (1) ◽

pp. 150-162 ◽

Author(s):

Anthony T Dibenedetto ◽

Daniel A Scola

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Adhesive Failure ◽

Ion Scattering ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

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Abstract: Surface analytical studies using ion scattering spectrometry, Auger electron spectroscopy and secondary ion mass spectrometry

Journal of Vacuum Science and Technology ◽

10.1116/1.568786 ◽

1975 ◽

Vol 12 (1) ◽

pp. 352-353 ◽

Author(s):

W. Heiland ◽

E. Taglauer

Keyword(s):

Mass Spectrometry ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Analytical Studies ◽

Ion Mass Spectrometry ◽

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The advantages of normal incidence ultra-low energy secondary ion mass spectrometry depth profiling

Applied Surface Science ◽

10.1016/s0169-4332(98)00812-5 ◽

1999 ◽

Vol 144-145 ◽

pp. 292-296 ◽

Author(s):

T.J Ormsby ◽

D.P Chu ◽

M.G Dowsett ◽

G.A Cooke ◽

S.B Patel

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Depth Profiling ◽

Normal Incidence ◽

Ion Mass Spectrometry ◽

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Ultrastatic secondary ion mass spectrometry using very-low-energy reactive ions

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/0168-583x(91)95188-j ◽

1991 ◽

Vol 59-60 ◽

pp. 116-119

Author(s):

Tanaka Tohru ◽

Maruo Tetsuya ◽

Homma Yoshikazu ◽

Kurosawa Satoru

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

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Ion scattering spectrometry and secondary ion mass spectrometry in the surface characterization of smut on stainless steel

Surface Technology ◽

10.1016/0376-4583(80)90099-0 ◽

1980 ◽

Vol 11 (6) ◽

pp. 385-391 ◽

Author(s):

W.L. Baun

Keyword(s):

Mass Spectrometry ◽

Stainless Steel ◽

Surface Characterization ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Ion Mass Spectrometry ◽

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Secondary ion mass spectrometry and ion scattering spectrometry determination of iodide distribution in Ag(Br,I)

Vacuum ◽

10.1016/s0042-207x(81)80427-7 ◽

1981 ◽

Vol 31 (4-5) ◽

pp. 212

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Ion Mass Spectrometry ◽

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