scholarly journals Comparison of the parasitic impedances from the drain‐source path of power transistor packages at up to 2 GHz

2021 ◽  
Author(s):  
Thomas Moldaschl ◽  
Stefan Woetzel ◽  
Riccardo Latella ◽  
Maurizio Galvano ◽  
Alfred Binder
Keyword(s):  
1989 ◽  
Vol 25 (15) ◽  
pp. 979 ◽  
Author(s):  
A.P. Long ◽  
I.H. Goodridge ◽  
J.P. King ◽  
A.J. Holden ◽  
J.G. Metcalfe ◽  
...  
Keyword(s):  

Author(s):  
P. Wang ◽  
J. Chen ◽  
P. Froess ◽  
S. Kakihana
Keyword(s):  

2015 ◽  
Vol 821-823 ◽  
pp. 810-813 ◽  
Author(s):  
Maxime Berthou ◽  
Dominique Planson ◽  
Dominique Tournier

With the commercial availability of SiC power transistors, this decade will mark an important breakthrough in power transistor technology. However, in power electronic systems, disturbances may place them in short-circuit condition and little knowledge exist about their SC capability. This paper presents our study of SiC MOSFETs, JFETs and BJT under capacitive load short-circuit up to 600V.


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