P-139L:Late-News Poster: AC Gate-Drain-Bias Stress Study of amorphous Indium Gallium Zinc Oxide Thin Film Transistors for GOA Applications

2012 ◽  
Vol 43 (1) ◽  
pp. 1126-1128 ◽  
Author(s):  
Chao-Yu Yang ◽  
Shih-Che Huang ◽  
Hao-Lin Chiu ◽  
Ting Hsieh ◽  
Bo-Liang Yeh ◽  
...  
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Thin Film Transistors ◽  
Oxide Thin Film ◽  
Indium Gallium Zinc Oxide ◽  
Zinc Oxide Thin Film ◽  
Bias Stress ◽  
Stress Study ◽  
Drain Bias ◽  
Indium Gallium

Light/negative bias stress instabilities in indium gallium zinc oxide thin film transistors explained by creation of a double donor

2012 ◽  
Vol 101 (12) ◽  
pp. 123502 ◽  
Author(s):  
Piero Migliorato ◽  
Md Delwar Hossain Chowdhury ◽  
Jae Gwang Um ◽  
Manju Seok ◽  
Jin Jang
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Thin Film Transistors ◽  
Oxide Thin Film ◽  
Negative Bias ◽  
Indium Gallium Zinc Oxide ◽  
Zinc Oxide Thin Film ◽  
Bias Stress ◽  
Indium Gallium
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