X-ray reflection from and transmission through a plane-parallel dielectric plate with cosine-like polarizability (symmetrical Laue case)

1988 ◽  
Vol 109 (1) ◽  
pp. 101-110 ◽  
Author(s):  
A. P. Bezirganyan
Keyword(s):  
Dielectric Plate ◽  
X Ray ◽  
Plane Parallel

scholarly journals X-ray scattering from a plane parallel slab using radiation transfer considerations

2020 ◽  
Vol 53 (5) ◽  
pp. 1236-1242
Author(s):  
Stanislav Stoupin
Keyword(s):  
Radiation Transfer ◽  
Slab Thickness ◽  
X Ray ◽  
Total Attenuation ◽  
Plane Parallel ◽  
X Ray Scattering ◽  
Scattering Geometry ◽  
Transfer Equations ◽  
Intensity Transfer ◽  
Ray Scattering

The X-ray scattering power of a plane parallel homogeneous slab of material is derived using radiation intensity transfer equations. The scattering power scales with the ratio of the scattering coefficient of interest to the total attenuation coefficient. The results can be used to guide the choice of slab thickness, scattering geometry and photon energy to maximize the scattering power in both elastic and inelastic X-ray scattering experiments.

scholarly journals X-ray Mini Testing Technology Based On Solid Plane-parallel Detectors

2017 ◽  
Vol 2017 (1) ◽  
pp. 25-29 ◽  
Author(s):  
V.A. Troitskii ◽  
◽  
S.R. Mikhailov ◽  
R.O. Pastovenskii ◽  
◽  
...  
Keyword(s):  
X Ray ◽  
Plane Parallel ◽  
Testing Technology

scholarly journals Effect of nanocoating morphology on the signal of X-ray Photoelectron Spectroscopy

2021 ◽  
Vol 2144 (1) ◽  
pp. 012007
Author(s):  
V P Afanas’ev ◽  
L G Lobanova ◽  
D N Selyakov ◽  
M A Semenov-Shefov
Keyword(s):  
Photoelectron Spectroscopy ◽  
Strong Dependence ◽  
Cluster Structure ◽  
Substrate Material ◽  
Homogeneous Layer ◽  
Viewing Angle ◽  
X Ray ◽  
Plane Parallel ◽  
Straight Line ◽  
The Mathematical Model

Abstract The paper considers the application of the traditional X-ray photoelectron spectroscopy (XPS) methodology: the Overlayer Thickness Determination for the analysis of coating parameters. In particular situations considered in this work, it is energetically favorable for the atoms of the coating to form clusters, but not be evenly distributed on the surface of the substrate material. The change in the XPS signal is analyzed in situations when the coating is not a plane-parallel homogeneous layer, but an island (cluster) structure. The mathematical model of the XPS signal formation is considered for the case of the cluster covering in the form of parallelepipeds. Photoelectron path distributions (in the coating material) analysis indicated a strong dependence of the signal on the viewing angle. For the purpose of analysis, experimental spectra were obtained for several samples: gold depositions of various thicknesses on a silicon substrate. The spectra were measured for different viewing angles of photoelectrons and interpreted within the Straight Line Approximation (SLA). It is shown that proposed simplest model of an island coating allows to describe the effect of a decrease in the value of the effective average coating thickness, determined in plane-parallel geometry, with an increase in the viewing angle, observed in XPS experiments with angular resolution.

scholarly journals X-ray interference fringes from a weakly bent plane-parallel crystal with negative strain gradient

2019 ◽  
Vol 75 (6) ◽  
pp. 842-850
Author(s):  
Tomoe Fukamachi ◽  
Sukswat Jongsukswat ◽  
Dongying Ju ◽  
Riichirou Negishi ◽  
Keiichi Hirano ◽  
...  
Keyword(s):  
Strain Gradient ◽  
Transmission Condition ◽  
Dynamical Theory ◽  
Perfect Crystal ◽  
Back Surface ◽  
Propagation Length ◽  
Transmitted Beam ◽  
X Ray ◽  
Plane Parallel ◽  
Interference Fringes

Under the anomalous transmission condition in the Bragg mode, X-ray interference fringes were observed between two beams with different hyperbolic trajectories in a very weakly bent plane-parallel perfect crystal with negative strain gradient. The origin of the fringes was analysed based on the dynamical theory of diffraction for a distorted crystal. In the reflected beam from the entrance surface, the interference fringes were observed between once- and twice-reflected beams from the back surface. In the transmitted beam from the back surface, the interference fringes were observed between the direct beam and once-reflected beam from the entrance surface. In the emitted beam from the lateral surface, the interference fringes were observed between the beams after different numbers of reflections in the crystal. The multiply reflected beams were formed by a combined result of long propagation length along the beam direction with large divergence of the refracted beams when the strain gradient was negative. The period of these interference fringes was sensitive to very weak strain, of the order of 10−7.

Absorption corrections for AEM Analysis of thin-film and sphere samples with large-solid-angle x-ray detectors

1989 ◽  
Vol 47 ◽  
pp. 206-207
Author(s):  
Nuri A. Zreiba ◽  
Thomas F. Kelly
Keyword(s):  
Thin Film ◽  
Solid Angle ◽  
X Rays ◽  
Ray Optics ◽  
X Ray ◽  
Plane Parallel ◽  
Recent Advances ◽  
Absorption Correction ◽  
Solid Angles ◽  
Sphere Geometry

Recent advances in x-ray detectors for TEM and STEM instruments have resulted in large increases in the solid angle that these detectors subtend with respect to the sample. These solid angles of order 0.2 steradian mean that x rays emitted into a cone of semi-angle equal to 15° will be intercepted by the detector. Since the conventional absorption correction for x-ray analysis assumes that all detected rays are parallel, we chose to examine whether divergent x rays could change the absorption and fluorescence corrections significantly and should therefore be taken into account.This paper will focus on the effects of such changes on the absorption correction of thin specimens. Two specimen geometries will be considered, namely the usual plane parallel slab and the sphere geometry. Sphere geometries are of interest because they are currently used in the evaluation of the efficiency of x-ray detectors, the results of which are to be presented in the X-ray Optics and Microanalysis Conference in Poland this summer.

scholarly journals Strain distribution in an Si single crystal measured by interference fringes of X-ray mirage diffraction

2013 ◽  
Vol 46 (5) ◽  
pp. 1261-1265 ◽  
Author(s):  
Sukswat Jongsukswat ◽  
Tomoe Fukamachi ◽  
Dongying Ju ◽  
Riichirou Negishi ◽  
Keiichi Hirano ◽  
...  
Keyword(s):  
Single Crystal ◽  
Strain Gradient ◽  
Residual Strain ◽  
Strain Distribution ◽  
X Rays ◽  
X Ray ◽  
Plane Parallel ◽  
Rod Theory ◽  
Interference Fringes ◽  
Incident Plane

In X-ray interference fringes accompanied by mirage diffraction, variations have been observed in the spacing and position of the fringes from a plane-parallel Si single crystal fixed at one end as a function of distance from the incident plane of the X-rays to the free crystal end. The variations can be explained by distortion of the sample crystal due to gravity. From the variations and positions of the fringes, the strain gradient of the crystal has been determined. The distribution of the observed strain agrees with that expected from rod theory except for residual strain. When the distortion is large, the observed strain distribution does not agree with that expected from rod theory.

scholarly journals The Hard X-ray Reflection on Cold Matter

1994 ◽  
Vol 159 ◽  
pp. 348-348
Author(s):  
E. Jourdain ◽  
J.P. Roques
Keyword(s):  
Monte Carlo ◽  
Monte Carlo Method ◽  
Cross Sections ◽  
Infinite Plane ◽  
Solar Abundance ◽  
X Ray ◽  
Direct Component ◽  
Plane Parallel ◽  
Γ Ray ◽  
Cold Matter

We have simulated the reflection on cold matter in a variety of situations to determine which informations can actually be inferred from observations. We modelled a semi-infinite plane parallel medium of solar abundance matter, semi-isotropically illuminated by a X/γ ray source. The spectra are calculated from a Monte-Carlo method without any approximation in the cross-sections. Θ is the angle over which the reflecting matter is seen (90°=face-on), Θ=all means a spatially integrated spectrum. Fref is the ratio of the reflected over direct component.

X-ray topographic study of dislocation around indents on {111} surfaces of indium antimonide

1987 ◽  
Vol 20 (6) ◽  
pp. 499-504 ◽  
Author(s):  
M. R. Surowiec ◽  
B. K. Tanner
Keyword(s):  
Edge Dislocation ◽  
Indium Antimonide ◽  
Direct Evidence ◽  
Dislocation Loops ◽  
X Ray ◽  
Plane Parallel ◽  
Extended Dislocation

The dislocation configurations around microindentations on {111} surfaces of InSb have been studied by transmission X-ray topography. In all cases, glide on the B-type {111} planes only occurs. The most extended dislocation loops occur around A-surface indents. Glide occurs on inclined {111} planes and the loops have extended screw segments parallel to the surface. Around B-surface indents dislocations glide predominantly on the ({\bar 1} {\bar 1} {\bar 1}) plane parallel to the surface. The mobility of these dislocations is about two or three times less than the former type. Direct evidence for the formation of edge dislocation barriers from reactions between dislocations gliding in the ({\bar 1} {\bar 1} {\bar 1}) plane is presented.

Studies in felspar equilibria at the Geophysical Laboratory, Washington

1951 ◽  
Vol 29 (215) ◽  
pp. 757-758 ◽  
Author(s):  
O. F. Tuttle
Keyword(s):  
Axial Plane ◽  
Optical Studies ◽  
X Ray ◽  
Plane Parallel ◽  
Transitional Forms

Evidence for the existence of four series of alkali-felspars has been obtained from X-ray studies of over forty analysed felspars.1 Optical studies confirm these findings, but suggest that transitional forms may occur. The four series are: high-sanidine- high-albite; sanidine high-albite; orthoclase low-albite;microcline-low-albite. Highsanidinc has the optic axial plane parallel to (010) in the potash-rich members, whereas it is perpendicular to (010) in sanidine.

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