Polymer ring formation by electron/hole injection from an STM tip into a C60 close-packed layer

2006 ◽  
Vol 243 (13) ◽  
pp. 3017-3020 ◽  
Author(s):  
Ryo Nouchi ◽  
Kosuke Masunari ◽  
Toshio Ohta ◽  
Yoshihiro Kubozono ◽  
Yoshihiro Iwasa
Keyword(s):  
Ring Formation ◽  
Hole Injection ◽  
Electron Hole ◽  
Packed Layer ◽  
Close Packed Layer

Tunable electron and hole injection channels at plasmonic Al-TiO2 interfaces

Nanoscale ◽  
2021 ◽  
Author(s):  
Jie Ma ◽  
Xindan Zhang ◽  
Shiwu Gao
Keyword(s):  
Spatial Separation ◽  
Metallic Nanostructures ◽  
Hole Injection ◽  
Hot Electron ◽  
Electron Hole ◽  
Metallic Nanostructure ◽  
Nonradiative Decay

Metallic nanostructures can strongly absorb light through their plasmon excitations, whose nonradiative decay generates hot electron-hole pairs. When the metallic nanostructure is interfaced with a semiconductor, the spatial separation of...

Characterizing local metallic bonding variation induced by external perturbation

2020 ◽  
Vol 22 (4) ◽  
pp. 2372-2378 ◽  
Author(s):  
Hongwei Wang ◽  
Jon Fuller ◽  
Peng Chen ◽  
Sergey I. Morozov ◽  
Qi An
Keyword(s):  
Density Gradient ◽  
External Perturbation ◽  
Hole Injection ◽  
Electron Hole ◽  
Fcc Metals ◽  
Reduced Density Gradient ◽  
Metallic Bonding ◽  
Reduced Density

The reduced density gradient analyses on metallic bonding indicate that FCC metals can become more flexible/stronger with the electron/hole injection.

Weak temperature-dependent hole injection and electron–hole recombination at the CH3NH3PbI3/NiO heterojunction: a time-domain ab initio study

2020 ◽  
Vol 8 (2) ◽  
pp. 607-615 ◽  
Author(s):  
Jinlu He ◽  
Wei-Hai Fang ◽  
Run Long
Keyword(s):  
Charge Carrier ◽  
Ab Initio ◽  
Time Domain ◽  
Carrier Dynamics ◽  
Hole Injection ◽  
Ab Initio Study ◽  
Temperature Dependent ◽  
Electron Hole ◽  
Charge Carrier Dynamics ◽  
Hole Recombination

Weak temperature-dependent photoexcitation charge carrier dynamics in the CH3NH3PbI3/NiO heterojunction.

scholarly journals Imperfections in the structure of cobalt. I. Experimental work and proposed structure

1942 ◽  
Vol 180 (982) ◽  
pp. 268-277 ◽  
Keyword(s):  
Experimental Work ◽  
The Other ◽  
X Ray ◽  
Packed Layer ◽  
Close Packed Layer

X-ray powder photographs of hexagonal cobalt have a remarkable mixture of sharp and diffuse lines. The sharp lines are those with 1/3 ( h - k ) integral and those with l zero; all others are more or less diffuse. An explanation of this is produced, based on the possibility of faults occurring in the structure because there are two different ways in which one close-packed layer of atoms can be put on to another. It is shown theoretically that if such faults are repeated at regular intervals the reflexions with 1/3 ( h - k ) integral are not affected, but the positions and intensities of the other lines are modified although they remain sharp. These results suggest that a structure with random faults would give broadened reflexions, but the broadening is such that it would not show for lines with l zero on powder photographs. Evidence from oscillation photographs and from measurement of a powder photograph is adduced in support of this theory.

Probing single-molecule electron–hole transfer dynamics at a molecule–NiO semiconductor nanocrystalline interface

2017 ◽  
Vol 19 (26) ◽  
pp. 17216-17223 ◽  
Author(s):  
Bharat Dhital ◽  
Vishal Govind Rao ◽  
H. Peter Lu
Keyword(s):  
Single Molecule ◽  
Fluorescence Intensity ◽  
Intensity Fluctuation ◽  
Hole Injection ◽  
Single Molecule Fluorescence ◽  
Electron Hole ◽  
Hole Transfer ◽  
Recombination Mechanism

We probe electron–hole injection as well as a recombination mechanism and dynamics at a dye–NiO interface based on single-molecule fluorescence intensity fluctuation and blinking measurements.

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