The secondary electron emission yield for 24 solid elements excited by primary electrons in the range 250-5000 ev: a theory/experiment comparison

Diamond whiskers were formed by etching diamond thin films using metal clusters as a shadow mask, which were deposited on the diamond film before or during etching. The whiskers were as thin as 100 nm and the density was as high as 1010/ cm 2. The secondary electron emission yield of the diamond whiskers was significantly reduced as compared to the initial diamond film. The decrease in the yield was more significant if the primary electrons were impinged in parallel direction with the whiskers. We suggest that absorption of the secondary electrons in the narrow gap between the whiskers was the reason for the decreased yield.

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Historical Introduction

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100077670 ◽

1977 ◽

Vol 35 ◽

pp. 2-5

Author(s):

R. D. Heidenreich

Keyword(s):

Electron Emission ◽

Secondary Electron ◽

Secondary Electron Emission ◽

50Th Anniversary ◽

Secondary Emission ◽

Wave Nature ◽

Nobel Prize In Physics ◽

Primary Electrons ◽

The U.S ◽

Mutual Agreement

This program has been organized by the EMSA to commensurate the 50th anniversary of the experimental verification of the wave nature of the electron. Davisson and Germer in the U.S. and Thomson and Reid in Britian accomplished this at about the same time. Their findings were published in Nature in 1927 by mutual agreement since their independent efforts had led to the same conclusion at about the same time. In 1937 Davisson and Thomson shared the Nobel Prize in physics for demonstrating the wave nature of the electron deduced in 1924 by Louis de Broglie.The Davisson experiments (1921-1927) were concerned with the angular distribution of secondary electron emission from nickel surfaces produced by 150 volt primary electrons. The motivation was the effect of secondary emission on the characteristics of vacuum tubes but significant deviations from the results expected for a corpuscular electron led to a diffraction interpretation suggested by Elasser in 1925.

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Secondary electron emission yield from vertical graphene nanosheets by helicon plasma deposition

Chinese Physics B ◽

10.1088/1674-1056/ac11dd ◽

2021 ◽

Author(s):

Xuelian Jin ◽

Peiyu Ji ◽

Lanjian Zhuge ◽

Xuemei Wu ◽

Chenggang Jin

Keyword(s):

Electron Emission ◽

Secondary Electron ◽

Plasma Deposition ◽

Graphene Nanosheets ◽

Secondary Electron Emission ◽

Helicon Plasma ◽

Emission Yield

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MAXIMUM SECONDARY ELECTRON YIELDS FROM SEMICONDUCTORS AND INSULATORS

Surface Review and Letters ◽

10.1142/s0218625x17500457 ◽

2016 ◽

Vol 24 (04) ◽

pp. 1750045 ◽

Cited By ~ 6

Author(s):

A. G. XIE ◽

Z. H. LIU ◽

Y. Q. XIA ◽

M. M. ZHU

Keyword(s):

Electron Emission ◽

Secondary Electron ◽

Maximum Yield ◽

Secondary Electron Emission ◽

High Energy ◽

Secondary Electrons ◽

Backscattered Electrons ◽

Universal Formula ◽

Yield Formula ◽

Primary Electrons

Based on the processes and characteristics of secondary electron emission and the formula for the yield due to primary electrons hitting on semiconductors and insulators, the universal formula for maximum yield [Formula: see text] due to primary electrons hitting on semiconductors and insulators was deduced, where [Formula: see text] is the maximum ratio of the number of secondary electrons produced by primary electrons to the number of primary electrons. On the basis of the formulae for primary range in different energy ranges of [Formula: see text], characteristics of secondary electron emission and the deduced universal formula for [Formula: see text], the formulae for [Formula: see text] in different energy ranges of [Formula: see text] were deduced, where [Formula: see text] is the primary incident energy at which secondary electron yields from semiconductors and insulators, [Formula: see text], are maximized to maximum secondary electron yields from semiconductors and insulators, [Formula: see text]; and [Formula: see text] is the maximum ratio of the number of total secondary electrons produced by primary electrons and backscattered electrons to the number of primary electrons. According to the deduced formulae for [Formula: see text], the relationship among [Formula: see text], [Formula: see text] and high-energy back-scattering coefficient [Formula: see text], the formulae for parameters of [Formula: see text] and the experimental data as well as the formulae for [Formula: see text] in different energy ranges of [Formula: see text] as a function of [Formula: see text], [Formula: see text], [Formula: see text] and [Formula: see text] were deduced, where [Formula: see text] and [Formula: see text] are the original electron affinity and the width of forbidden band, respectively. The scattering of [Formula: see text] was analyzed, and calculated [Formula: see text] values were compared with the values measured experimentally. It was concluded that the deduced formulae for [Formula: see text] were found to be universal for [Formula: see text].

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