scholarly journals Two-dimensional simulation and modeling in scanning electron microscope imaging and metrology research

Scanning ◽  
2006 ◽  
Vol 24 (4) ◽  
pp. 179-185 ◽  
Author(s):  
Michael T. Postek ◽  
András E. Vladár ◽  
Jeremiah R. Lowney ◽  
William J. Keery
Sign in / Sign up

Export Citation Format

Share Document