Metrology of multilayer Laue lens structures by means of scanning electron microscope imaging

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ◽

10.1016/j.nima.2009.11.015 ◽

2010 ◽

Vol 616 (2-3) ◽

pp. 89-92 ◽

Author(s):

N. Jahedi ◽

R. Conley ◽

B. Shi ◽

J. Qian ◽

K. Lauer ◽

...

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Laue Lens ◽

Microscope Imaging ◽

Electron Microscope Imaging ◽

Scanning Electron

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SCANNING ELECTRON MICROSCOPE IMAGING OF AMYLOID FIBRILS

American Journal of Biochemistry and Biotechnology ◽

10.3844/ajbbsp.2014.31.39 ◽

2014 ◽

Vol 10 (1) ◽

pp. 31-39 ◽

Author(s):

Takai

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Amyloid Fibrils ◽

Microscope Imaging ◽

Electron Microscope Imaging ◽

Scanning Electron

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Low-voltage high-resolution scanning electron microscope imaging of the uncoated and Cr-coated zeolite Beta

Microporous and Mesoporous Materials ◽

10.1016/j.micromeso.2005.12.019 ◽

2006 ◽

Vol 92 (1-3) ◽

pp. 165-172 ◽

Author(s):

Stephane Bazzana ◽

Seyda Dumrul ◽

Juliusz Warzywoda ◽

Albert Sacco

Keyword(s):

Electron Microscope ◽

High Resolution ◽

Scanning Electron Microscope ◽

Low Voltage ◽

Zeolite Beta ◽

Microscope Imaging ◽

Electron Microscope Imaging ◽

Scanning Electron

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Quantitative Detection of Individual Cleaved DNA Molecules on Surfaces Using Gold Nanoparticles and Scanning Electron Microscope Imaging

Analytical Chemistry ◽

10.1021/ac052067g ◽

2006 ◽

Vol 78 (5) ◽

pp. 1528-1534 ◽

Author(s):

Bei Nie ◽

Michael R. Shortreed ◽

Lloyd M. Smith

Keyword(s):

Gold Nanoparticles ◽

Electron Microscope ◽

Scanning Electron Microscope ◽

Quantitative Detection ◽

Dna Molecules ◽

Microscope Imaging ◽

Electron Microscope Imaging ◽

Scanning Electron

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Local dynamic range compensation for scanning electron microscope imaging system

Scanning ◽

10.1002/sca.21226 ◽

2015 ◽

Vol 37 (6) ◽

pp. 381-388 ◽

Author(s):

K.S. Sim ◽

Y.H. Huang

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Dynamic Range ◽

Imaging System ◽

Local Dynamic ◽

Microscope Imaging ◽

Electron Microscope Imaging ◽

Scanning Electron

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Adaptive noise Wiener filter for scanning electron microscope imaging system

Scanning ◽

10.1002/sca.21250 ◽

2015 ◽

Vol 38 (2) ◽

pp. 148-163 ◽

Author(s):

K. S. Sim ◽

V. Teh ◽

M. E. Nia

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Imaging System ◽

Wiener Filter ◽

Microscope Imaging ◽

Adaptive Noise ◽

Electron Microscope Imaging ◽

Scanning Electron

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A real-time image dynamic range compensation for scanning electron microscope imaging system

Scanning ◽

10.1002/sca.4950270407 ◽

2006 ◽

Vol 27 (4) ◽

pp. 199-207 ◽

Author(s):

K. S. Sim ◽

N. S. Kamel ◽

H. T. Chuah

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Real Time ◽

Dynamic Range ◽

Imaging System ◽

Real Time Image ◽

Microscope Imaging ◽

Electron Microscope Imaging ◽

Scanning Electron

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Scanning electron microscope imaging of grain structure and phase distribution within gas-hydrate-bearing intervals from JAPEX/JNOC/GSC et al. Mallik 5L-38: what can we learn from comparisons with laboratory-synthesized samples?

10.4095/220811 ◽

2005 ◽

Author(s):

L A Stern ◽

S H Kirby ◽

W B Durham

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Gas Hydrate ◽

Phase Distribution ◽

Grain Structure ◽

Microscope Imaging ◽

Electron Microscope Imaging ◽

Scanning Electron

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Local dynamic range compensation for scanning electron microscope imaging system by average mid-point local recursive mean separate histogram equalization

2016 International Conference on Robotics, Automation and Sciences (ICORAS) ◽

10.1109/icoras.2016.7872629 ◽

2016 ◽

Author(s):

K. S. Sim ◽

V. Teh ◽

C. K. Lim

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Dynamic Range ◽

Imaging System ◽

Histogram Equalization ◽

Local Dynamic ◽

Microscope Imaging ◽

Electron Microscope Imaging ◽

Scanning Electron

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Two-dimensional simulation and modeling in scanning electron microscope imaging and metrology research

Scanning ◽

10.1002/sca.4950240404 ◽

2006 ◽

Vol 24 (4) ◽

pp. 179-185 ◽

Author(s):

Michael T. Postek ◽

András E. Vladár ◽

Jeremiah R. Lowney ◽

William J. Keery

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Two Dimensional ◽

Simulation And Modeling ◽

Microscope Imaging ◽

Metrology Research ◽

Dimensional Simulation ◽

Electron Microscope Imaging ◽

Scanning Electron

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Compressibility of geothermal reservoir rocks from the Wairakei-Tauhara fields with insights gained from geotechnical laboratory testing and scanning electron microscope imaging

Volcanic Rocks and Soils ◽

10.1201/b18897-12 ◽

2015 ◽

pp. 109-110

Author(s):

M.J. Pender ◽

B.Y. Lynne

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Laboratory Testing ◽

Geothermal Reservoir ◽

Reservoir Rocks ◽

Microscope Imaging ◽

Electron Microscope Imaging ◽

Scanning Electron

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