Quantitative determination of surface energy using atomic force microscopy: the case of hydrophobic/hydrophobic contact and hydrophilic/hydrophilic contact

Surface and Interface Analysis ◽

10.1002/sia.2076 ◽

2005 ◽

Vol 37 (9) ◽

pp. 755-764 ◽

Author(s):

Houssein Awada ◽

Gilles Castelein ◽

Maurice Brogly

Keyword(s):

Atomic Force Microscopy ◽

Surface Energy ◽

Quantitative Determination ◽

Hydrophobic Contact ◽

Force Microscopy ◽

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In situ quantitative determination of the intermolecular attraction between amines and a graphene surface using atomic force microscopy

Journal of Colloid and Interface Science ◽

10.1016/j.jcis.2020.07.112 ◽

2021 ◽

Vol 581 ◽

pp. 385-395

Author(s):

Yuyao Zhang ◽

Xiaoying Zhu ◽

Xin Li ◽

Baoliang Chen

Keyword(s):

Atomic Force Microscopy ◽

Quantitative Determination ◽

Graphene Surface ◽

Force Microscopy ◽

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Quantitative determination of Young's modulus on a biphase polymer system using atomic force microscopy

Surface and Interface Analysis ◽

10.1002/1096-9918(200008)30:1<185::aid-sia862>3.0.co;2-d ◽

2000 ◽

Vol 30 (1) ◽

pp. 185-189 ◽

Author(s):

C. Reynaud ◽

F. Sommer ◽

C. Quet ◽

N. El Bounia ◽

Tran Minh Duc

Keyword(s):

Atomic Force Microscopy ◽

Quantitative Determination ◽

Young’S Modulus ◽

Young's Modulus ◽

Polymer System ◽

Force Microscopy ◽

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Determination of near-surface forces in optical polishing using atomic force microscopy

Nanotechnology ◽

10.1088/0957-4484/5/2/002 ◽

1994 ◽

Vol 5 (2) ◽

pp. 70-79 ◽

Author(s):

M J Cumbo ◽

S D Jacobs

Keyword(s):

Atomic Force Microscopy ◽

Surface Forces ◽

Near Surface ◽

Force Microscopy ◽

Atomic Force ◽

Optical Polishing

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Experimental determination of the mechanical impedance of atomic force microscopy cantilevers in fluids up to 70 kHz

Journal of Applied Physics ◽

10.1063/1.1287522 ◽

2000 ◽

Vol 88 (5) ◽

pp. 2912-2920 ◽

Author(s):

Marc P. Scherer ◽

Gerhard Frank ◽

Anthony W. Gummer

Keyword(s):

Atomic Force Microscopy ◽

Experimental Determination ◽

Mechanical Impedance ◽

Force Microscopy ◽

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Determination of spatial resolution in atomic-force-microscopy-based electrical characterization techniques using quantum well structures

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.1835317 ◽

2005 ◽

Vol 23 (1) ◽

pp. 61 ◽

Author(s):

O. Douhéret ◽

S. Bonsels ◽

S. Anand

Keyword(s):

Atomic Force Microscopy ◽

Quantum Well ◽

Spatial Resolution ◽

Electrical Characterization ◽

Quantum Well Structures ◽

Force Microscopy ◽

Characterization Techniques ◽

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Determination of electrostatic force and its characteristics based on phase difference by amplitude modulation atomic force microscopy

Nanoscale Research Letters ◽

10.1186/s11671-016-1765-2 ◽

2016 ◽

Vol 11 (1) ◽

Author(s):

Kesheng Wang ◽

Jia Cheng ◽

Shiji Yao ◽

Yijia Lu ◽

Linhong Ji ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Phase Difference ◽

Amplitude Modulation ◽

Electrostatic Force ◽

Force Microscopy ◽

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Determination of the surface area of annealed continuous gold film and pyrex glass in situ by the BET adsorption isotherm and ex situ by Atomic Force Microscopy in air

Applied Surface Science ◽

10.1016/s0169-4332(98)00297-9 ◽

1998 ◽

Vol 135 (1-4) ◽

pp. 8-14 ◽

Author(s):

L Stobiński ◽

L Zommer

Keyword(s):

Atomic Force Microscopy ◽

Adsorption Isotherm ◽

Surface Area ◽

Gold Film ◽

Ex Situ ◽

Pyrex Glass ◽

Force Microscopy ◽

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Determination of solid surface tension at the nano-scale using atomic force microscopy

Contact Angle, Wettability and Adhesion, Volume 4 ◽

10.1201/b12166-17 ◽

2006 ◽

pp. 249-276

Keyword(s):

Surface Tension ◽

Atomic Force Microscopy ◽

Solid Surface ◽

Force Microscopy ◽

Atomic Force ◽

Solid Surface Tension

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Determination of Microdomain Size in Langmuir-Blodgett Films of Binary Mixtures by IR Spectroscopy and Atomic Force Microscopy

Progress in Fourier Transform Spectroscopy ◽

10.1007/978-3-7091-6840-0_177 ◽

1997 ◽

pp. 683-685

Author(s):

Suci Widayati ◽

Richard A. Dluhy

Keyword(s):

Atomic Force Microscopy ◽

Ir Spectroscopy ◽

Binary Mixtures ◽

Force Microscopy ◽

Langmuir Blodgett ◽

Atomic Force ◽

Langmuir Blodgett Films

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Determination of Punica granatum L. Carpellary membrane elastic properties using atomic force microscopy

Recent Advances in Multidisciplinary Applied Physics ◽

10.1016/b978-008044648-6/50020-3 ◽

2005 ◽

pp. 119-125

Author(s):

M MILLAN ◽

M GASQUE ◽

F GARCIADIEGO ◽

J CURIEL ◽

G RUIZ

Keyword(s):

Atomic Force Microscopy ◽

Elastic Properties ◽

Punica Granatum ◽

Force Microscopy ◽

Atomic Force ◽

Punica Granatum L

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