System for Non-Dispersive Analysis of Lunar X-Rays from Apollo

1970 ◽  
pp. 330-341 ◽  
Author(s):  
P. Gorenstein ◽  
H. Gursky ◽  
I. Adler ◽  
J. Trombka
Keyword(s):  
X Rays ◽  
Dispersive Analysis

System for Non-Dispersive Analysis of Lunar X-Rays from Apollo

1969 ◽  
Vol 13 ◽  
pp. 330-341
Author(s):  
P. Gorenstein ◽  
H. Gursky ◽  
I. Adler ◽  
J. Trombka
Keyword(s):  
Chemical Composition ◽  
Lunar Surface ◽  
Regional Differences ◽  
Detection System ◽  
X Rays ◽  
X Ray ◽  
Service Module ◽  
Dispersive Analysis ◽  
Theoretical Performance

A non-dispersive X-ray detection system consisting of proporticnal counters plus filters is being prepared for the Command-Service Module of the Apollo spacecraft as part of a “geochemistry“ package. It will detect solar induced characteristic X-rays from the abundant elements on the lunar surface during the orbiting phases of the mission. The objective will be a compilation of a map of the lunar chemical composition and to detect regional differences. The system and its theoretical performance are described.

Studies on the distribution of reinforcement in composites by energy dispersive analysis of X-rays

1991 ◽  
Vol 12 (6) ◽  
pp. 447-451 ◽  
Author(s):  
K. V. Rao ◽  
G. C. Pandey ◽  
S. F. Xavier ◽  
Y. N. Sharma
Keyword(s):  
Energy Dispersive ◽  
X Rays ◽  
Energy Dispersive Analysis ◽  
Dispersive Analysis

scholarly journals Electrochemical Migration in Thick-Film IC-S

1985 ◽  
Vol 11 (4) ◽  
pp. 281-290 ◽  
Author(s):  
Gabor Ripka ◽  
Gabor Harsanyi
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Thick Film ◽  
Electrochemical Migration ◽  
X Rays ◽  
Scattered Electron ◽  
X Ray ◽  
Short Summary ◽  
Dispersive Analysis ◽  
Scanning Electron

The phenomenon of silver migration in conductor-insulator systems is well known, but it is less known that several other metals can exhibit migration. This paper tries to give a short summary of the phenomenon as applied to thick-film circuits.Tests have been made on different conductors used in thick-film circuits. The dendrites formed by electrochemical migration were examined by scanning electron microscope, and also by wavelength-dispersive analysis of the emitted x-rays. By obtaining secondary and back-scattered electron images, x-ray maps and profiles, it can be determined which components cause migration in the conductor in question.Photos are presented illustrating the results.Thermal Humidity Bias test was also performed in controlled environmental chambers in order to get a comparison between different thick film systems.

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