scholarly journals Electrochemical Migration in Thick-Film IC-S

1985 ◽  
Vol 11 (4) ◽  
pp. 281-290 ◽  
Author(s):  
Gabor Ripka ◽  
Gabor Harsanyi
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Thick Film ◽  
Electrochemical Migration ◽  
X Rays ◽  
Scattered Electron ◽  
X Ray ◽  
Short Summary ◽  
Dispersive Analysis ◽  
Scanning Electron

The phenomenon of silver migration in conductor-insulator systems is well known, but it is less known that several other metals can exhibit migration. This paper tries to give a short summary of the phenomenon as applied to thick-film circuits.Tests have been made on different conductors used in thick-film circuits. The dendrites formed by electrochemical migration were examined by scanning electron microscope, and also by wavelength-dispersive analysis of the emitted x-rays. By obtaining secondary and back-scattered electron images, x-ray maps and profiles, it can be determined which components cause migration in the conductor in question.Photos are presented illustrating the results.Thermal Humidity Bias test was also performed in controlled environmental chambers in order to get a comparison between different thick film systems.

X-ray micro tomography in the scanning electron microscope

1978 ◽  
Vol 36 (1) ◽  
pp. 106-107 ◽  
Author(s):  
W. Brünger
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Target Surface ◽  
The Body ◽  
X Rays ◽  
Cross Sectional ◽  
X Ray ◽  
Micro Tomography ◽  
Scanning Electron

Reconstructive tomography is a new technique in diagnostic radiology for imaging cross-sectional planes of the human body /1/. A collimated beam of X-rays is scanned through a thin slice of the body and the transmitted intensity is recorded by a detector giving a linear shadow graph or projection (see fig. 1). Many of these projections at different angles are used to reconstruct the body-layer, usually with the aid of a computer. The picture element size of present tomographic scanners is approximately 1.1 mm2.Micro tomography can be realized using the very fine X-ray source generated by the focused electron beam of a scanning electron microscope (see fig. 2). The translation of the X-ray source is done by a line scan of the electron beam on a polished target surface /2/. Projections at different angles are produced by rotating the object.During the registration of a single scan the electron beam is deflected in one direction only, while both deflections are operating in the display tube.

PHAX-SCAN: Functional integration of a Scanning Electron Microscope and an energy-dispersive x-ray analyser

1989 ◽  
Vol 47 ◽  
pp. 56-57
Author(s):  
Marc H. Peeters ◽  
Max T. Otten
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
Functional Integration ◽  
Energy Dispersive ◽  
X Rays ◽  
X Ray ◽  
High Speed Analysis ◽  
Scanning Electron

Over the past decades, the combination of energy-dispersive analysis of X-rays and scanning electron microscopy has proved to be a powerful tool for fast and reliable elemental characterization of a large variety of specimens. The technique has evolved rapidly from a purely qualitative characterization method to a reliable quantitative way of analysis. In the last 5 years, an increasing need for automation is observed, whereby energy-dispersive analysers control the beam and stage movement of the scanning electron microscope in order to collect digital X-ray images and perform unattended point analysis over multiple locations.The Philips High-speed Analysis of X-rays system (PHAX-Scan) makes use of the high performance dual-processor structure of the EDAX PV9900 analyser and the databus structure of the Philips series 500 scanning electron microscope to provide a highly automated, user-friendly and extremely fast microanalysis system. The software that runs on the hardware described above was specifically designed to provide the ultimate attainable speed on the system.

Combined Electron Excitation and X-Ray Excitation for Spectrometry in the SEM

2013 ◽  
Vol 21 (4) ◽  
pp. 24-28 ◽  
Author(s):  
Kenny C. Witherspoon ◽  
Brian J. Cross ◽  
Mandi D. Hellested
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Electron Excitation ◽  
X Rays ◽  
X Ray ◽  
Analytical Technique ◽  
Atomic Electrons ◽  
Non Destructive ◽  
Scanning Electron

Energy-dispersive X-ray spectrometry (EDS) is an analytical technique used to determine elemental composition. It is a powerful, easy-to-use, non-destructive technique that can be employed for a wide variety of materials. In this technique the electron beam of the scanning electron microscope (SEM) impinges on the sample and excites atomic electrons causing the production of characteristic X rays. These characteristic X rays have energies specific to elements in the sample. The EDS detector collects these X rays as a signal and produces a spectrum. Samples also can be excited by X rays. Collimated and focused X rays from an X-ray source produce characteristic X rays that can be detected by the same EDS detector. When X rays are used as the source of excitation, the method is then called X-ray fluorescence (XRF) or micro-XRF.

Synthesis and Characterization of CuO/SnO2 Nanocomposites

2014 ◽  
Vol 575 ◽  
pp. 175-179 ◽  
Author(s):  
Supakorn Pukird ◽  
Dheerachai Polsongkram ◽  
Suttinart Noothongkeaw ◽  
Khanidtha Jantasom ◽  
Ki Seok An
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Synthesis And Characterization ◽  
Photoemission Spectroscopy ◽  
Distilled Water ◽  
X Rays ◽  
X Ray ◽  
Coprecipitation Process ◽  
Scanning Electron

CuO/SnO2 nanocomposites materials were prepared by solution coprecipitation process using CuO nanowires-rods and SnO2 nanowires mixture as a starting materials. The mixture materials were put in beaker glass with distilled water and magnetic stering at 90 oC for 3 h. The mixture materials were filtered and heated at 980 oC for 20 h. The prepared products were investigated by FE scanning electron microscope (FESEM), X-rays photoemission spectroscopy (XPS) and X-ray driffraction technique (XRD). The results showed nanocomposites structures which consisting of CuO and SnO2 phase.

scholarly journals ANALYSIS OF SUBMICROSCOPIC STRUCTURES BY THEIR EMITTED X-RAYS

1973 ◽  
Vol 21 (6) ◽  
pp. 580-586 ◽  
Author(s):  
E. W. DEMPSEY ◽  
F. J. AGATE ◽  
M. LEE ◽  
M. L. PURKERSON
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Semiconductor Detector ◽  
Emission Spectra ◽  
Energy Dispersive ◽  
X Rays ◽  
Sodium Potassium ◽  
X Ray ◽  
Copper Zinc ◽  
Scanning Electron

X-ray emission spectra have been recorded from several biologic tissues using a multichannel energy-dispersive analyzer with a retractible semiconductor detector coupled to a Cambridge Mark II scanning electron microscope. Particular attention has been given to the detection of silver in experimental argyria, of calcium in dermoid scales and in experimental necrosis of the kidney and of sulfur in the inner and outer portions of reptilian skin. Sulfur and chlorine have been found associated with silver in argyria. Phosphorus was associated with calcium both in the dermal scales and in necrotic areas. In addition to these elements, trace amounts of copper, zinc, lead, sodium, potassium, iron, arsenic, osmium and uranium have been detected in various normal and experimental situations. The applicability of the combined instrument to cytochemical problems is briefly discussed.

scholarly journals Enhancement of Low Energy / Light Element Energy Dispersive Analysis in the Scanning Electron Microscope Using a Non-Focusing X-Ray Optic

2009 ◽  
Vol 15 (S2) ◽  
pp. 218-219
Author(s):  
RE Edelmann ◽  
V Vasudevan ◽  
D Kohls ◽  
J Ullmer
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Element ◽  
Low Energy ◽  
Energy Dispersive ◽  
Energy Dispersive Analysis ◽  
X Ray ◽  
Dispersive Analysis ◽  
Scanning Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

scholarly journals KATALIS KARBON YANG DIBUAT DENGAN METODE HUMMERS TERMODIFIKASI UNTUK ASETILASI GLISEROL

2021 ◽  
Vol 6 (2) ◽  
pp. 95
Author(s):  
Nur Hidayati ◽  
Wahib Khoiruddin ◽  
Isnadiah Endang Mastuti ◽  
Wahyu Devi Satna Pambudi
Keyword(s):  
Carbon Nanotubes ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Raw Material ◽  
Biodiesel Production ◽  
X Rays ◽  
X Ray ◽  
Multi Walled Carbon Nanotubes ◽  
Walled Carbon Nanotubes ◽  
Scanning Electron

Gliserol adalah produk samping yang dihasilkan dari proses pembuatan biodiesel. Karena peningkatan produksi biodiesel, utilisasi gliserol yang melimpah menjadi asetin berpeluang dilakukan karena manfaat asetin sebagai sumber bahan baku untuk material lainnya yang bernilai lebih. Penelitian ini bertujuan untuk membuat katalis grafena oksida dari multi-walled carbon nanotubes (MWCNT) dengan menggunakan metode hummers termodifikasi. Karakterisasi katalis GO dilakukan dengan menggunakan uji X-Rays Diffraction (XRD) dan Scanning Electron Microscope-Energi Dispersive X-ray (SEM-EDX). Aktivitas katalitik pada asetilasi gliserol menunjukkan konversi yang tinggi mencapai 94% pada suhu 110°C dalam 2 jam reaksi dengan menggunakan katalis 3% berat. Kata kunci: Asetilasi, Gliserol, Grafena Oksida, Metode Hummers Termodifikasi AbstractGlycerol is a by-product of biodiesel production. Due to the increase in biodiesel production, the utilization of abundant glycerol into acetin has the opportunity to be carried out because of the benefits of acetin as a source of raw material for other materials of higher value. This study aims to prepare graphene oxide catalysts from multi-walled carbon nanotubes (MWCNT) using the modified Hummers method. The characterizations of GO catalyst were assessed using X-Rays Diffraction (XRD) and Scanning Electron Microscope-Energi Dispersive X-ray (SEM-EDX). The catalytic activity of glycerol acetylation showed a high conversion reaching 94% at 110°C in 2 hours of reaction using a 3% by weight catalyst.

scholarly journals Penyelidikan Karakteristik Lapisan Diamond Film Pahat Karbida Terhadap Pembebanan Mekanik Pada Pembubutan Kering

2017 ◽  
Vol 1 (1) ◽  
pp. 32 ◽  
Author(s):  
Fransnazoan Sitorus ◽  
Armasyah Ginting ◽  
Basuki Wirjosentono
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Diamond Film ◽  
Energy Dispersive ◽  
Energy Dispersive Analysis ◽  
X Ray ◽  
Dispersive Analysis ◽  
Scanning Electron

Penelitian ini bertujuan untuk mengkarakterisasi lapisan diamond-film yang digunakan sebagai bahan pelapis pahat karbida khususnya bahan pelapis (diamond-film CVD), sehubungan dengan adanya laporan penelitian perihal kegagalan fungsi dari bahan pelapis pahat karbida yang digunakan pada proses pemesinan kering bahan non-ferro metal pada awal proses pemotongan berlangsung (initial wear). Kajian karakteristik lapisan diamond-film pahat dilakukan melalui pendekatan beban mekanik melalui proses pemesinan kering menggunakan bahan paduan aluminium 6061. Kondisi pemotongan yaitu v= 350 m/min; f= 0.15 mm/put; a= 1.5 mm pada fasa Initial-wear (tc= 1.736 min). Uji beban mekanik menggunakan bahan uji berkekerasan berbeda, Aluminium 6061 (53.3 HRB/95 HV) dan AISI 1070 (93.3 HRB/200 HV), hasil pengujian pada bahan uji Aluminium 6061 diperoleh keadaan Aus-abrasive VB= 0.070 mm, dan pada bahan uji AISI 1070 diperoleh keadaan Aus tepi VB= 0.250 mm, analisa menggunakan scanning electron microscope (SEM) dan energy dispersive analysis X-Ray spectroscopy (EDAX), hasil pengujian diperoleh sebaran unsur pelapis diamond-film pada bahan uji Aluminium 6061 terhadap kondisi pemotongan diperoleh keadaan unsur material pelapis diamond film masih signifikan. Kemudian pada bahan uji AISI 1070 terhadap kedua kondisi pemotongan diperoleh keadaan unsur material pelapis diamond-film signifikan. Dari hasil penelitian disimpulkan bahwa pendekatan beban mekanik tidak ditemukan peristiwa pengelupasan lapisan diamond-film pahat karbida, fenomena yang terjadi terhadap ketiga pendekatan yang dilakukan adalah peristiwa hilang bertahapnya sebagian volume material pelapis diamond-film yang melapisi material substrate akibat Aus pengikisan lapisan (abrasive-coating wear).

Magnetic Domain Observation of an Amorphous Fe-Si-B Ribbon by Means of a High Voltage Scanning Electron Microscope

1981 ◽  
Vol 39 ◽  
pp. 320-321
Author(s):  
K. Tsuno ◽  
Y. Harada ◽  
T. Sato
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Voltage ◽  
Amorphous Ribbon ◽  
Image Resolution ◽  
Objective Lens ◽  
Magnetic Domains ◽  
Scattered Electron ◽  
Voltage Scanning ◽  
Scanning Electron

Magnetic domains of ferromagnetic amorphous ribbon have been observed using Bitter powder method. However, the domains of amorphous ribbon are very complicated and the surface of ribbon is not flat, so that clear domain image has not been obtained. It has been desired to observe more clear image in order to analyze the domain structure of this zero magnetocrystalline anisotropy material. So, we tried to observe magnetic domains by means of a back-scattered electron mode of high voltage scanning electron microscope (HVSEM).HVSEM method has several advantages compared with the ordinary methods for observing domains: (1) high contrast (0.9, 1.5 and 5% at 50, 100 and 200 kV) (2) high penetration depth of electrons (0.2, 1.5 and 8 μm at 50, 100 and 200 kV). However, image resolution of previous HVSEM was quite low (maximum magnification was less than 100x), because the objective lens cannot be excited for avoiding the application of magnetic field on the specimen.

Sign in / Sign up

Export Citation Format

Share Document