X-Rays for Non-Destructive Characterization of Materials Properties

Author(s):  
Volker Weiss
2021 ◽  
Vol 173 ◽  
pp. 110894
Author(s):  
Ercan Cakmak ◽  
Philip Bingham ◽  
Ross W. Cunningham ◽  
Anthony D. Rollett ◽  
Xianghui Xiao ◽  
...  

2001 ◽  
Vol 34 (6) ◽  
pp. 744-750 ◽  
Author(s):  
E. M. Lauridsen ◽  
S. Schmidt ◽  
R. M. Suter ◽  
H. F. Poulsen

A method is presented for fast and non-destructive characterization of the individual grains inside bulk materials (powders or polycrystals). The positions, volumes and orientations of hundreds of grains are determined simultaneously. An extension of the rotation method is employed: a monochromatic beam of high-energy X-rays, focused in one dimension, impinges on the sample and the directions of the diffracted beams are traced by translation of two-dimensional detectors. Algorithms suitable for on-line analysis are described, including a novel indexing approach, where the crystal symmetry is used directly by scanning in Euler space. The method is verified with a simulation of 100 grains.


2017 ◽  
Vol 30 (3) ◽  
pp. 9-16 ◽  
Author(s):  
Jun-Sang Park ◽  
John Okasinski ◽  
Kamalika Chatterjee ◽  
Yiren Chen ◽  
Jonathan Almer

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