Principles, Methods and Performance Limits

1997 ◽  
pp. 9-77 ◽  
Author(s):  
Umberto Mengali ◽  
Aldo N. D’Andrea
Keyword(s):  
Performance Limits ◽  
And Performance

scholarly journals Phasor Measurement Units Optimal Placement and Performance Limits for Fault Localization

2020 ◽  
Vol 38 (1) ◽  
pp. 180-192 ◽  
Author(s):  
Mahdi Jamei ◽  
Raksha Ramakrishna ◽  
Teklemariam Tesfay ◽  
Reinhard Gentz ◽  
Ciaran Roberts ◽  
...  
Keyword(s):  
Fault Localization ◽  
Phasor Measurement Units ◽  
Optimal Placement ◽  
Performance Limits ◽  
Phasor Measurement ◽  
Measurement Units ◽  
And Performance

scholarly journals Performance Measures of Different Gate Oxide Materials in Gate All Around Fet

2020 ◽  
Vol 9 (2) ◽  
pp. 23-25
Keyword(s):  
High Performance ◽  
Field Effect Transistors ◽  
Gate Oxide ◽  
Oxide Semiconductor ◽  
Oxide Materials ◽  
Performance Limits ◽  
Short Channel ◽  
Advanced Technique ◽  
And Performance

The classical planar Metal Oxide Semiconductor Field Effect Transistors (MOSFET) is fabricated by oxidation of a semiconductor namely Silicon. In this generation, an advanced technique called 3D system architecture FETs, are introduced for high performance and low power quality of devices. Based on the limitations of Short Channel Effect (SCE), Silicon (Si) FET cannot be scaled under 10nm. Hence various performing measures like methods, principles, and geometrics are done to upscale the semiconductor. CMOS using alternate channel materials like GE and III-Vs on substrates is a highly anticipated technique for developing nanowire structures. By considering these issues, in this paper, we developed a simulation model that provides accurate results basing on Gate layout and multi-gate NW FET's so that the scaling can be increased few nanometers long and performance limits gradually increases. The model developed is SILVACO that tests the action of FET with different gate oxide materials.

scholarly journals Atomically Thin CBRAM Enabled by 2-D Materials: Scaling Behaviors and Performance Limits

2018 ◽  
Vol 65 (10) ◽  
pp. 4160-4166 ◽  
Author(s):  
Zhipeng Dong ◽  
Huan Zhao ◽  
Don DiMarzio ◽  
Myung-Geun Han ◽  
Lihua Zhang ◽  
...  
Keyword(s):  
Performance Limits ◽  
And Performance
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