Multiple Point Cutting Processes

Author(s):  
Steven Y. Liang ◽  
Albert J. Shih
1961 ◽  
Vol 40 (2) ◽  
pp. 122 ◽  
Author(s):  
J. Cherry
Keyword(s):  

Author(s):  
Kristopher D. Staller

Abstract Cold temperature failures are often difficult to resolve, especially those at extreme low levels (< -40°C). Momentary application of chill spray can confirm the failure mode, but is impractical during photoemission microscopy (PEM), laser scanning microscopy (LSM), and multiple point microprobing. This paper will examine relatively low-cost cold temperature systems that can hold samples at steady state extreme low temperatures and describe a case study where a cold temperature stage was combined with LSM soft defect localization (SDL) to rapidly identify the cause of a complex cold temperature failure mechanism.


2009 ◽  
Vol 30 (19) ◽  
pp. 3372-3380 ◽  
Author(s):  
Mario Castaño-Álvarez ◽  
Ana Fernández-la-Villa ◽  
Diego F. Pozo-Ayuso ◽  
María Teresa Fernández-Abedul ◽  
Agustín Costa-García

PAMM ◽  
2021 ◽  
Vol 20 (1) ◽  
Author(s):  
Xialong Ye ◽  
Juan Manuel Rodríguez Prieto ◽  
Ralf Müller

2021 ◽  
Vol 42 (3) ◽  
Author(s):  
Rudolf Aro ◽  
Mohamed Wajdi Ben Ayoub ◽  
Ivo Leito ◽  
Éric Georgin ◽  
Benoit Savanier

AbstractIn the field of water content measurement, the calibration of coulometric methods (e.g., coulometric Karl Fischer titration or evolved water vapor analysis) is often overlooked. However, as coulometric water content measurement methods are used to calibrate secondary methods, their results must be obtained with the highest degree of confidence. The utility of calibrating such instruments has been recently demonstrated. Both single and multiple point calibration methods have been suggested. This work compares these calibration methods for the evolved water vapor analysis technique. Two uncertainty estimation approaches (Kragten’s spreadsheet and M-CARE software tool) were compared as well, both based on the ISO GUM method.


Materials ◽  
2021 ◽  
Vol 14 (6) ◽  
pp. 1563
Author(s):  
Ruibing Wu ◽  
Ziping Yu ◽  
Donghong Ding ◽  
Qinghua Lu ◽  
Zengxi Pan ◽  
...  

As promising technology with low requirements and high depositing efficiency, Wire Arc Additive Manufacturing (WAAM) can significantly reduce the repair cost and improve the formation quality of molds. To further improve the accuracy of WAAM in repairing molds, the point cloud model that expresses the spatial distribution and surface characteristics of the mold is proposed. Since the mold has a large size, it is necessary to be scanned multiple times, resulting in multiple point cloud models. The point cloud registration, such as the Iterative Closest Point (ICP) algorithm, then plays the role of merging multiple point cloud models to reconstruct a complete data model. However, using the ICP algorithm to merge large point clouds with a low-overlap area is inefficient, time-consuming, and unsatisfactory. Therefore, this paper provides the improved Offset Iterative Closest Point (OICP) algorithm, which is an online fast registration algorithm suitable for intelligent WAAM mold repair technology. The practicality and reliability of the algorithm are illustrated by the comparison results with the standard ICP algorithm and the three-coordinate measuring instrument in the Experimental Setup Section. The results are that the OICP algorithm is feasible for registrations with low overlap rates. For an overlap rate lower than 60% in our experiments, the traditional ICP algorithm failed, while the Root Mean Square (RMS) error reached 0.1 mm, and the rotation error was within 0.5 degrees, indicating the improvement of the proposed OICP algorithm.


1997 ◽  
Author(s):  
Patrizia Sforza ◽  
Dario de Blasiis ◽  
V. Lombardo ◽  
Vincenzo Santacesaria ◽  
M. Dell'Erba

2020 ◽  
Vol 53 (3) ◽  
pp. 283-288
Author(s):  
Muhammad Atayyab Shahid ◽  
Tariq Mairaj Khan ◽  
Kevin Lontin ◽  
Kanza Basit ◽  
Muhammad Khan

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