Low Temperature Fault Isolation Using Soft Defect Localization

2012 ◽  
Author(s):  
Kristopher D. Staller
Keyword(s):  
Low Temperatures ◽  
Laser Scanning ◽  
Low Cost ◽  
Fault Isolation ◽  
Laser Scanning Microscopy ◽  
Cold Temperature ◽  
Multiple Point ◽  
Defect Localization ◽  
Low Levels

Abstract Cold temperature failures are often difficult to resolve, especially those at extreme low levels (< -40°C). Momentary application of chill spray can confirm the failure mode, but is impractical during photoemission microscopy (PEM), laser scanning microscopy (LSM), and multiple point microprobing. This paper will examine relatively low-cost cold temperature systems that can hold samples at steady state extreme low temperatures and describe a case study where a cold temperature stage was combined with LSM soft defect localization (SDL) to rapidly identify the cause of a complex cold temperature failure mechanism.

scholarly journals Software-Based Three-Dimensional Deconvolution Microscopy of Cytoskeletal Proteins in Cultured Fibroblast Using Open-Source Software and Open Hardware

2019 ◽  
Vol 5 (12) ◽  
pp. 88
Author(s):  
Kazuo Katoh
Keyword(s):  
Open Source ◽  
Open Source Software ◽  
Laser Scanning ◽  
Low Cost ◽  
Three Dimensional ◽  
Cytoskeletal Proteins ◽  
Laser Scanning Microscopy ◽  
Confocal Laser ◽  
Actual Measurement ◽  
Open Hardware

As conventional fluorescence microscopy and confocal laser scanning microscopy generally produce images with blurring at the upper and lower planes along the z-axis due to non-focal plane image information, the observation of biological images requires “deconvolution.” Therefore, a microscope system’s individual blur function (point spread function) is determined theoretically or by actual measurement of microbeads and processed mathematically to reduce noise and eliminate blurring as much as possible. Here the author describes the use of open-source software and open hardware design to build a deconvolution microscope at low cost, using readily available software and hardware. The advantage of this method is its cost-effectiveness and ability to construct a microscope system using commercially available optical components and open-source software. Although this system does not utilize expensive equipment, such as confocal and total internal reflection fluorescence microscopes, decent images can be obtained even without previous experience in electronics and optics.

Asymmetric Data-Frequency Mapping and Multi Trigger-Probing for Improved Scan Debug

2018 ◽  
Author(s):  
Swaminathan ◽  
Anuradha ◽  
Abuayob ◽  
Eli ◽  
Konstantine Gitelmkher ◽  
...  
Keyword(s):  
Integrated Circuit ◽  
Laser Scanning ◽  
Continuous Wave ◽  
Signal To Noise Ratio ◽  
Fault Isolation ◽  
Laser Scanning Microscopy ◽  
Mapping Technique ◽  
Acquisition Time ◽  
Scan Chain ◽  
Continuous Wave Signal

Abstract Integrated-circuit device dimensions continue to shrink, enabling higher density of devices and smaller node size. A number of strategies to improve the resolution of failure analysis and fault isolation tools exist, but some of these techniques are reaching fundamental limits so that engineers are also challenged to innovative methods to increase the useful life of existing toolsets. Laser Scanning Microscopy including Laser Voltage Probing and frequency mapping struggle to maintain resolution commensurate with shrinking feature size. Here we present two methods to improve efficiency and capability of this toolset using existing optical hardware and configuration. The first method applies a frequency mapping technique using scan chain data patterns that allow for data manipulation. This enables an effective resolution increase through deconvolution of data collected in a sequence of scans completed on varied device states. A second method using multiple triggers per loop to evaluate a deterministic continuous wave signal is shown to reduce probe acquisition time, improve job throughput time, and enable, better signal-to-noise ratio for common scan chain debug workflow.

scholarly journals Progress towards Sustainable Control of Xylella fastidiosa subsp. pauca in Olive Groves of Salento (Apulia, Italy)

Pathogens ◽  
2021 ◽  
Vol 10 (6) ◽  
pp. 668
Author(s):  
Marco Scortichini ◽  
Stefania Loreti ◽  
Nicoletta Pucci ◽  
Valeria Scala ◽  
Giuseppe Tatulli ◽  
...  
Keyword(s):  
Control Strategy ◽  
Laser Scanning ◽  
Vascular System ◽  
Xylella Fastidiosa ◽  
Low Cost ◽  
Interdisciplinary Studies ◽  
Laser Scanning Microscopy ◽  
Confocal Laser ◽  
Olive Groves

Xylella fastidiosa subsp. pauca is the causal agent of “olive quick decline syndrome” in Salento (Apulia, Italy). On April 2015, we started interdisciplinary studies to provide a sustainable control strategy for this pathogen that threatens the multi-millennial olive agroecosystem of Salento. Confocal laser scanning microscopy and fluorescence quantification showed that a zinc-copper-citric acid biocomplex—Dentamet®—reached the olive xylem tissue either after the spraying of the canopy or injection into the trunk, demonstrating its effective systemicity. The biocomplex showed in vitro bactericidal activity towards all X. fastidiosa subspecies. A mid-term evaluation of the control strategy performed in some olive groves of Salento indicated that this biocomplex significantly reduced both the symptoms and X. f. subsp. pauca cell concentration within the leaves of the local cultivars Ogliarola salentina and Cellina di Nardò. The treated trees started again to yield. A 1H-NMR metabolomic approach revealed, upon the treatments, a consistent increase in malic acid and γ-aminobutyrate for Ogliarola salentina and Cellina di Nardò trees, respectively. A novel endotherapy technique allowed injection of Dentamet® at low pressure directly into the vascular system of the tree and is currently under study for the promotion of resprouting in severely attacked trees. There are currently more than 700 ha of olive groves in Salento where this strategy is being applied to control X. f. subsp. pauca. These results collectively demonstrate an efficient, simple, low-cost, and environmentally sustainable strategy to control this pathogen in Salento.

scholarly journals A Selective Ratiometric Fluorescent Probe for No-Wash Detection of PVC Microplastic

Polymers ◽  
2021 ◽  
Vol 13 (10) ◽  
pp. 1588
Author(s):  
Valeria Caponetti ◽  
Alexandra Mavridi-Printezi ◽  
Matteo Cingolani ◽  
Enrico Rampazzo ◽  
Damiano Genovese ◽  
...  
Keyword(s):  
Laser Scanning ◽  
Direct Detection ◽  
Low Cost ◽  
Laser Scanning Microscopy ◽  
Confocal Laser ◽  
Wide Field ◽  
Fluorescence Intensity Ratio ◽  
Green Fluorescence ◽  
One Pot ◽  
Emerging Pollutant

Microplastics (MP) are micrometric plastic particles present in drinking water, food and the environment that constitute an emerging pollutant and pose a menace to human health. Novel methods for the fast detection of these new contaminants are needed. Fluorescence-based detection exploits the use of specific probes to label the MP particles. This method can be environmentally friendly, low-cost, easily scalable but also very sensitive and specific. Here, we present the synthesis and application of a new probe based on perylene-diimide (PDI), which can be prepared in a few minutes by a one-pot reaction using a conventional microwave oven and can be used for the direct detection of MP in water without any further treatment of the sample. The green fluorescence is strongly quenched in water at neutral pH because of the formation dimers. The ability of the probe to label MP was tested for polyvinyl chloride (PVC), polyethylene (PE), polyethylene terephthalate (PET), polypropylene (PP), polystyrene (PS), poly methyl methacrylate (PMMA) and polytetrafluoroethylene (PTFE). The probe showed considerable selectivity to PVC MP, which presented an intense red emission after staining. Interestingly, the fluorescence of the MP after labeling could be detected, under excitation with a blue diode, with a conventional CMOS color camera. Good selectivity was achieved analyzing the red to green fluorescence intensity ratio. UV–Vis absorption, steady-state and time-resolved fluorescence spectroscopy, fluorescence anisotropy, fluorescence wide-field and confocal laser scanning microscopy allowed elucidating the mechanism of the staining in detail.

Research on Printed Conductive Silver Layer based on Inkjet Photo Paper

2021 ◽  
Author(s):  
Yi Fang ◽  
Lixin Mo ◽  
Zhiqing Xin ◽  
Yinjie Chen ◽  
Xiu Li ◽  
...  
Keyword(s):  
High Performance ◽  
Laser Scanning ◽  
Low Cost ◽  
Flexible Substrate ◽  
Electronic Devices ◽  
Laser Scanning Microscopy ◽  
Silver Layer ◽  
Confocal Laser ◽  
Nano Silver ◽  
Silver Ink

Printed electronics is an emerging technology that applies traditional printing or coating processes to the manufacture of electronic devices and products. In order to find a low-cost, high-performance, environmentally-friendly flexible substrate suitable for electronic devices, the printability between four kinds of inkjet photo papers and nano-silver ink was investigated. First, different surface morphologies of the inkjet photo papers were measured by a confocal laser scanning microscopy. Then, a pen and a gravure printer were used to test the printability between photo papers and nano-silver ink. It was found that the conductive track and pattern was influenced by the surface morphology of the photo papers. Furthermore, a four-probe test showed that the conductivity of the ink layers on the four photo papers was almost at the same level. Furthermore, a tearing test with 3 M tapes showed that the silk photo paper had the best tearing resistance. In general, silk photo paper has the best overall performance. This research could be beneficial for the development of flexible electronic devices which are low-cost, mass manufacture suitable and environment friendly.

Laser Scanning Localization Technique for Fast Analysis of High Speed DRAM Devices

2008 ◽  
Author(s):  
Martin Versen ◽  
Achim Schramm ◽  
Jan Schnepp ◽  
Sascha Hoch ◽  
Tapan Vikas ◽  
...  
Keyword(s):  
Integrated Circuit ◽  
High Speed ◽  
Laser Scanning ◽  
Random Access ◽  
Laser Scanning Microscopy ◽  
New Method ◽  
Temperature Influence ◽  
Fast Analysis ◽  
Knowledge Based ◽  
Defect Localization

Abstract Soft defect localization (SDL) is a method of laser scanning microscopy that utilizes the changing pass/fail behavior of an integrated circuit under test and temperature influence. Historically the pass and fail states are evaluated by a tester that leads to long and impracticable measurement times for dynamic random access memories (DRAM). The new method using a high speed comparison device allows SDL image acquisition times of a few minutes and a localization of functional DRAM fails that are caused by defects in the DRAM periphery that has not been possible before. This new method speeds up significantly the turn-around time in the failure analysis (FA) process compared to knowledge based FA.

scholarly journals Suitability Study of Structure-from-Motion for the Digitisation of Architectural (Heritage) Spaces to Apply Divergent Photograph Collection

Symmetry ◽  
2020 ◽  
Vol 12 (12) ◽  
pp. 1981
Author(s):  
Juan Moyano ◽  
Juan E. Nieto-Julián ◽  
Daniel Antón ◽  
Elena Cabrera ◽  
David Bienvenido-Huertas ◽  
...  
Keyword(s):  
Structure From Motion ◽  
Laser Scanning ◽  
Low Cost ◽  
Point Clouds ◽  
Control Points ◽  
Architectural Heritage ◽  
High Definition ◽  
Symmetrical Configuration ◽  
Architectural Spaces

The digitisation of architectural heritage has experienced a great development of low-cost and high-definition data capture technologies, thus enabling the accurate and effective modelling of complex heritage assets. Accordingly, research has identified the best methods to survey historic buildings, but the suitability of Structure-from-Motion/Multi-view-Stereo (SfM/MVS) for interior square symmetrical architectural spaces is unexplored. In contrast to the traditional SfM surveying for which the camera surrounds the object, the photograph collection approach is divergent in courtyards. This paper evaluates the accuracy of SfM point clouds against Terrestrial Laser Scanning (TLS) for these large architectural spaces with a symmetrical configuration, with the main courtyard of Casa de Pilatos in Seville, Spain, as a case study. Two different SfM surveys were conducted: (1) Without control points, and (2) referenced using a total station. The first survey yielded unacceptable results: A standard deviation of 0.0576 m was achieved in the northwest sector of the case study, mainly because of the difficulty of aligning the SfM and TLS data due to the way they are produced. This value could be admissible depending on the purpose of the photogrammetric model.

scholarly journals Novel Defect Detection Using Laser-Based Imaging and TIVA with a Visible Laser

2013 ◽  
Author(s):  
Mary A. Miller ◽  
Paiboon Tangyunyong ◽  
Edward I. Cole ◽  
Alejandro Pimentel ◽  
Darlene M. Udoni
Keyword(s):  
Case Studies ◽  
Laser Scanning ◽  
Laser Scanning Microscopy ◽  
Induced Voltage ◽  
Thermally Induced ◽  
First Case ◽  
Reflected Light ◽  
Visible Laser ◽  
532 Nm

Abstract This paper presents two different case studies that highlight the use of reflected light imaging in laser scanning microscopy. In the first case study, the exact location of defects in metal comb test structures were much easier to detect with reflected light imaging than with thermally-induced voltage alteration (TIVA). This case study also shows visible-wavelength TIVA defect localization using a 532-nm laser. A comparison between 532-nm TIVA and conventional 1320-nm TIVA is made to show the resolution improvement with the visible laser. In the second case study, the cause of a linear string of bit failures was localized easily with backside reflected light imaging. It is observed that the indicated sites matched the light-induced voltage alteration signals and the failing cells in the bit map. In both of the case studies, the reflected light images have proved very helpful in the localization and characterization of failing devices or test structures.

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