Laser Interactions with Organic/Polymer Materials

The rapid development of integrated circuit technology from small-scale integration (SSI) to very large scale integration (VLSI) has had great technological and economical impact on the electronics industry. The exponential growth of the number of components per IC chip, the exponential decrease of device dimensions, and the steady increase in IC chip size have imposed stringent requirements, not only on the IC physical design and fabrication, but also on IC encapsulants. This report addresses the purpose of encapsulation, encapsulation techniques, and a general overview of the application of inorganic and organic polymer materials as electronic device encapsulants.

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ULTRAFAST VIBRONIC DYNAMICS OF FUNCTIONAL ORGANIC POLYMER MATERIALS: COHERENCE, CONFINEMENT, AND DISORDER

Proceedings of the 73rd International Symposium on Molecular Spectroscopy ◽

10.15278/isms.2018.ma02 ◽

2018 ◽

Author(s):

Irene Burghardt

Keyword(s):

Polymer Materials ◽

Organic Polymer

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Charging of Small Particles in the Scanning Electron Microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100115018 ◽

1975 ◽

Vol 33 ◽

pp. 278-279

Author(s):

W. Krakow ◽

W. C. Nixon

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Charge Density ◽

Negative Charge ◽

Polymer Materials ◽

Primary Beam ◽

Organic Polymer ◽

Electron Trajectories ◽

Electron Image ◽

Scanning Electron

Charging effects in the scanning electron microscope (SEM) have been investigated and various contrast mechanisms have been explained which include both the primary beam and secondary electron trajectories and take into account specimen parameters. In particular, Weitzenkamp measured potentials of cylindrical fibers which could be suspended above a replica of a ruled surface to measure charge density on these organic polymer materials.We have been able to obtain the equivalent information on the charge density from SEM micrographs of small charged particles. Fig. 1, shows a backseattered electron image of a 10μm polystyrene particle supported on a gold coated linear hologram grating having spacing of approximately 3.6μm. The grating distortion indicates a strong negative charge on the particle which deflects the 10 kV primary beam. The grating distortion is asynmetric due to a specimen tilt of 70 degrees.

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