Structure and Optical Absorption of LiyV2O5 Thin Films

Author(s):  
A. Talledo ◽  
A. M. Andersson ◽  
C. G. Granqvist
2020 ◽  
Vol 2 (3) ◽  
Author(s):  
Lukas Terkowski ◽  
Iain W. Martin ◽  
Daniel Axmann ◽  
Malte Behrendsen ◽  
Felix Pein ◽  
...  

1989 ◽  
Vol 172 (2) ◽  
pp. 179-183 ◽  
Author(s):  
G. Micocci ◽  
R. Rella ◽  
A. Tepore

1993 ◽  
Vol 65-66 ◽  
pp. 313-318 ◽  
Author(s):  
M. Di Giulio ◽  
M.C. Nicotra ◽  
M. Re ◽  
R. Rella ◽  
P. Siciliano

1991 ◽  
Vol 69 (3-4) ◽  
pp. 317-323 ◽  
Author(s):  
Constantinos Christofides ◽  
Andreas Mandelis ◽  
Albert Engel ◽  
Michel Bisson ◽  
Gord Harling

A photopyroelectric spectrometer with real-time and(or) self-normalization capability was used for both conventional transmission and thermal-wave spectroscopic measurements of amorphous Si thin films, deposited on crystalline Si substrates. Optical-absorption-coefficient spectra were obtained from these measurements and the superior dynamic range of the out-of-phase (quadrature) photopyroelectric signal was established as the preferred measurement method, owing to its zero-background compensation capability. An extension of a photopyroelectric theoretical model was established and successfully tested in the determination of the optical absorption coefficient and the thermal diffusivity of the sample under investigation. Instrumental sensitivity limits of βt ≈ 5 × 10−3 were demonstrated.


2018 ◽  
Vol 173 (11-12) ◽  
pp. 1075-1082 ◽  
Author(s):  
Gennady Remnev ◽  
Jindrich Musil ◽  
Vladislav Tarbokov ◽  
Sergey Pavlov ◽  
Fedor Konusov ◽  
...  

1990 ◽  
Vol 25 (2) ◽  
pp. 209-213 ◽  
Author(s):  
V. P. Bhatt ◽  
K. Gireesan ◽  
C. F. Desai

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