Hydrogen Ion Bombardment in Secondary Ion Mass Spectrometry

Springer Series in Chemical Physics - Secondary Ion Mass Spectrometry SIMS IV ◽

10.1007/978-3-642-82256-8_16 ◽

1984 ◽

pp. 57-59 ◽

Author(s):

V. T. Cherepin ◽

A. A. Kosyachkov ◽

I. N. Makeeva

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Bombardment ◽

Hydrogen Ion ◽

Ion Mass Spectrometry ◽

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Significant improvement in depth resolution of Cr/Ni interfaces by secondary ion mass spectrometry profiling under normal O2+ion bombardment

Applied Physics Letters ◽

10.1063/1.107397 ◽

1992 ◽

Vol 60 (10) ◽

pp. 1178-1180 ◽

Author(s):

Kyung Joong Kim ◽

Dae Won Moon

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Depth Resolution ◽

Ion Bombardment ◽

Ion Mass Spectrometry ◽

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Is proton cationization promoted by polyatomic primary ion bombardment during time-of-flight secondary ion mass spectrometry analysis of frozen aqueous solutions?

Rapid Communications in Mass Spectrometry ◽

10.1002/rcm.2446 ◽

2006 ◽

Vol 20 (8) ◽

pp. 1327-1334 ◽

Author(s):

Xavier A. Conlan ◽

Nicholas P. Lockyer ◽

John C. Vickerman

Keyword(s):

Mass Spectrometry ◽

Aqueous Solutions ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Ion Bombardment ◽

Mass Spectrometry Analysis ◽

Spectrometry Analysis ◽

Ion Mass Spectrometry ◽

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Degradation of poly(acrylates) under SF5+ primary ion bombardment studied using time-of-flight secondary ion mass spectrometry. 1. Effect of main chain and pendant methyl groups

Surface and Interface Analysis ◽

10.1002/sia.2006 ◽

2005 ◽

Vol 37 (1) ◽

pp. 42-52 ◽

Author(s):

M. S. Wagner

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Ion Bombardment ◽

Methyl Groups ◽

Ion Mass Spectrometry ◽

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Evaluation of sputtering induced surface roughness development of Ni/Cu multilayers thin films by Time-of-Flight Secondary Ion Mass Spectrometry depth profiling with different energies O2+ ion bombardment

Thin Solid Films ◽

10.1016/j.tsf.2018.10.049 ◽

2019 ◽

Vol 669 ◽

pp. 188-197

Author(s):

X.L. Yan ◽

M.M. Duvenhage ◽

J.Y. Wang ◽

H.C. Swart ◽

J.J. Terblans

Keyword(s):

Mass Spectrometry ◽

Surface Roughness ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Depth Profiling ◽

Ion Bombardment ◽

Ion Mass Spectrometry ◽

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Degradation of poly(acrylates) under SF5+ primary ion bombardment studied using time-of-flight secondary ion mass spectrometry. 2. Poly(n-alkyl methacrylates)

Surface and Interface Analysis ◽

10.1002/sia.2007 ◽

2005 ◽

Vol 37 (1) ◽

pp. 53-61 ◽

Author(s):

M. S. Wagner

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Ion Bombardment ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Alkyl Methacrylates

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Evaluation of polyencapsulation, oxygen leak, and low energy ion bombardment in the reduction of secondary ion mass spectrometry surface ion yield transients

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.586356 ◽

1992 ◽

Vol 10 (1) ◽

pp. 342 ◽

Author(s):

S. F. Corcoran

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Bombardment ◽

Ion Mass Spectrometry ◽

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An Auger electron spectroscopy-secondary ion mass spectrometry study of layers of Cu-Ni and Ag-Au alloys modified by ion bombardment

Thin Solid Films ◽

10.1016/0040-6090(79)90025-7 ◽

1979 ◽

Vol 63 (2) ◽

pp. 263-268 ◽

Author(s):

Masao Yabumoto ◽

Hiroshi Kakibayashi ◽

Mamoru Mohri ◽

Kuniaki Watanabe ◽

Toshiro Yamashina

Keyword(s):

Mass Spectrometry ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Secondary Ion Mass Spectrometry ◽

Ion Bombardment ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

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O3+ cluster primary ion bombardment for secondary ion mass spectrometry

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/s0168-583x(97)00075-x ◽

1997 ◽

Vol 124 (1) ◽

pp. 91-94 ◽

Author(s):

Hideyuki Yamazaki ◽

Yuichiro Mitani

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Bombardment ◽

Ion Mass Spectrometry ◽

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Degradation of poly(acrylates) under SF5+ primary ion bombardment studied using time-of-flight secondary ion mass spectrometry. 3. Poly(hydroxyethyl methacrylate) with chemical derivatization

Surface and Interface Analysis ◽

10.1002/sia.2008 ◽

2005 ◽

Vol 37 (1) ◽

pp. 62-70 ◽

Author(s):

M. S. Wagner

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Ion Bombardment ◽

Hydroxyethyl Methacrylate ◽

Chemical Derivatization ◽

Ion Mass Spectrometry ◽

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ChemInform Abstract: DEPTH PROFILING OF N-TYPE DOPANTS IN SILICON AND GALLIUM ARSENIDE USING CESIUM(+) ION BOMBARDMENT NEGATIVE SECONDARY ION MASS SPECTROMETRY IN ULTRAHIGH VACUUM

Chemischer Informationsdienst ◽

10.1002/chin.197931001 ◽

1979 ◽

Vol 10 (31) ◽

Author(s):

C. W. MAGEE

Keyword(s):

Mass Spectrometry ◽

Gallium Arsenide ◽

Secondary Ion Mass Spectrometry ◽

Depth Profiling ◽

Ultrahigh Vacuum ◽

Ion Bombardment ◽

Ion Mass Spectrometry ◽

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