Nanostructured Thick-Film Spinel Ceramic Materials for Sensor Device Applications

Author(s):  
H. Klym ◽  
Ivan Karbovnyk
Seikei-Kakou ◽  
2019 ◽  
Vol 31 (9) ◽  
pp. 334-337
Author(s):  
Junji Akimoto ◽  
Hiroshi Nagata ◽  
Kunimitsu Kataoka ◽  
Tadayoshi Akao ◽  
Jun Akedo

2021 ◽  
pp. 71-79
Author(s):  
Vandana ◽  
Reema Gupta ◽  
R. P. Tandon ◽  
Monika Tomar ◽  
Vinay Gupta

2014 ◽  
Vol 2014 ◽  
pp. 1-1
Author(s):  
Liang-Wen Ji ◽  
Sheng-Joue Young ◽  
Chih-Hung Hsiao ◽  
Artde Donald Kin-Tak Lam

1992 ◽  
Vol 52 (1-3) ◽  
pp. 189-196
Author(s):  
D PATIL ◽  
N VENKATRAMANI ◽  
V ROHATGI ◽  
B MUTSUDDY

2016 ◽  
Vol 776 ◽  
pp. 012061 ◽  
Author(s):  
I D. P. Hermida ◽  
G. Wiranto ◽  
Hiskia ◽  
R. Nopriyanti

2015 ◽  
Vol 27 (4) ◽  
pp. 157-163
Author(s):  
Jakub Somer ◽  
Michal Štekovič ◽  
František Urban ◽  
Josef Šandera ◽  
Ivan Szendiuch

Purpose – The purpose of this paper is to focus on a description of reliable bonding technique of zero-shrink low-temperature co-fired ceramic (LTCC) and alumina ceramics. LTCC is widely used for manufacturing electrical systems in 3D configuration. LTCC substrates were so far bonded with alumina ceramics using additional adhesive layers with subsequent firing or curing cycle. With the advent of the zero-shrink LTCC substrates, it is now possible to bond unfired substrates with other fired substrates, for example fired LTCC or alumina substrates. Alumina substrate in combination with LTCC brings advantages of good thermal conductivity for usage in heating elements or packaging. Design/methodology/approach – The test structure contains a thick-film pattern for verification of the compatibility of the bonding process. We have used two methods for bonding the substrates: cold chemical lamination (CCL) and thermo compression method, using a dielectric thick-film paste as the adhesive. Optical microscopy, scanning electron microscopy and electric testing of the screen-printed patterns were used for verification of the bonding quality. Findings – The thermo-compression method gave poor results in comparison with the CCL method. The best quality of lamination was achieved at room temperature combined with low pressure for both types of bonding materials. In addition, a possibility of using this bonding method for sensor fabrication was investigated. The ceramic pressure sensor samples with a cavity were created. Originality/value – The possibility of bonding two different ceramic materials was investigated. A new approach to ceramic bonding showed promising results with possible use in sensors.


Author(s):  
Jung Ouk Kim ◽  
Yongwan Lee ◽  
Jongsik Lim ◽  
Dal Ahn ◽  
Won-Sang Yoon ◽  
...  

2014 ◽  
Vol 54 (12) ◽  
pp. 2843-2848 ◽  
Author(s):  
H. Klym ◽  
V. Balitska ◽  
O. Shpotyuk ◽  
I. Hadzaman

Materials ◽  
2022 ◽  
Vol 15 (2) ◽  
pp. 624
Author(s):  
Ruozheng Wang ◽  
Fang Lin ◽  
Qiang Wei ◽  
Gang Niu ◽  
Hong-Xing Wang

This paper investigates the formation and propagation of defects in the heteroepitaxial growth of single-crystal diamond with a thick film achieving 500 µm on Ir (001)/Al2O3 substrate. The growth of diamond follows the Volmer–Weber mode, i.e., initially shows the islands and subsequently coalesces to closed films. The films’ strain imposed by the substrate gradually relaxed as the film thickness increased. It was found that defects are mainly located at the diamond/Ir interface and are then mainly propagated along the [001] direction from the nucleation region. Etching pits along the [001] direction formed by H2/O2 plasma treatment were used to show defect distribution at the diamond/Ir/Al2O3 interface and in the diamond bulk, which revealed the reduction of etching pit density in diamond thick-film surface. These results show the evident impact of the thickness on the heteroepitaxially grown diamond films, which is of importance for various device applications.


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