Influence of the soldering paste type on optical and thermal parameters of LED modules

Purpose This paper presents the results of the investigations of LED modules soldered with the use of different soldering pastes. Design/methodology/approach The tested power LED modules are soldered using different solder pastes and soldering processes. Thermal parameters of the performed modules are tested using indirect electrical methods. The results of measurements obtained for different modules are compared and discussed. Findings It was shown that the soldering process visibly influences the results of measurements of optical and thermal parameters of LED modules. For example, values of thermal resistance of these modules and the efficiency of conversion of electrical energy into light differ between each other even by 15%. Practical implications The obtained results of investigations can be usable for designers of the assembly process of power LED modules. Originality/value This paper shows the investigations results in the area of effective assembly of power LEDs to the metal core printed circuit board (MCPCB) using different soldering pastes (REL22, REL61, LMPA-Q6, OM-5100, OM-338-PT, M8, OM-340, CVP-390). It was shown that the best thermal and optical properties of these modules are obtained for the OM5100 paste by Alpha Assembly.

Study of mechanical properties of indium-based solder alloys for cryogenic applications

Purpose This study aims to develop indium-based solders for cryogenic applications. Design/methodology/approach This paper aims to investigate mechanical properties of indium-based solder formulations at room temperature (RT, 27 °C) as well as at cryogenic temperature (CT, −196 °C) and subsequently to find out their suitability for cryogenic applications. After developing these alloys, mechanical properties such as tensile and impact strength were measured as per American Society for Testing and Materials standards at RT and at CT. Charpy impact test results were used to find out ductile to brittle transition temperature (DBTT). These properties were also evaluated after thermal cycling (TC) to find out effect of thermal stress. Scanning electron microscope analysis was performed to understand fracture mechanism. Results indicate that amongst the solder alloys that have been studied in this work, In-34Bi solder alloy has the best all-round mechanical properties at RT, CT and after TC. Findings It can be concluded from the results of this work that In-34Bi solder alloy has best all-round mechanical properties at RT, CT and after TC and therefore is the most appropriate solder alloy amongst the alloys that have been studied in this work for cryogenic applications Originality/value DBTT of indium-based solder alloys has not been found out in the work done so far in this category. DBTT is necessary to decide safe working temperature range of the alloy. Also the effect of TC, which is one of the major reasons of failure, was not studied so far. These parameters are studied in this work.

Investigation of solder beading phenomenon under surface-mounted electrolytic capacitors

Purpose The purpose of this paper is to study the solder beading phenomenon (referring to larger-sized solder balls) of surface-mounted electrolytic capacitors. Solder beading could induce failures by violating the minimal electrical clearance on the printed circuit board (PCB). In modern lead-free reflow soldering, especially in high-reliability industries, such as automotive, aeroplane and aerospace, detecting and preventing such defects is essential in reliable and cost-effective manufacturing. Design/methodology/approach The large size of the involved components may block the view of automatic optical inspection; therefore, X-ray inspection is necessary. To detect the failure mode, X-ray imaging, cross-section grinding, optical microscopy and Fourier transformed infrared spectroscopy were used. High-resolution noncontact profilometry and optical microscopy were used to analyse component designs. The surface mounting process steps were also analysed to reveal their dependence on the issue. Test methods were designed and performed to reveal the behaviour of the solder paste (SP) during the reflow soldering process and to emphasise the component design relevance. Findings It was found that the reduction of SP volume only reduces the failure rate but does not solve the problem. Results show that excessive component placement pressure could induce solder beading. Statistical analysis revealed that differences between distinct components had the highest effect on the solder beading rate. Design aspects of solder beading-prone components were identified and discussed as the primary source of the problem. Practical implications The findings can be applied in surface-mount technology production, where the total failure count and resulting failure costs could be reduced according to the findings. Originality/value This paper shows that component design aspects such as the low distance between the underside of the component and the PCB and blocked proper outgassing of volatile compounds of the SP can be root causes of solder beading under surface-mounted electrolytic capacitors.

Analytical and numerical analyses of filling progression and void formation in flip-chip underfill encapsulation process

Purpose This paper aims to study the filling progression of underfill flow and void formation during the flip-chip encapsulation process. Design/methodology/approach A new parameter of filling progression that relates volume fraction filled to filling displacement was formulated analytically. Another indicative parameter of filling efficiency was also introduced to quantify the voiding fraction in filling progression. Additionally, the underfill process on different flip-chips based on the past experiments was numerically simulated. Findings All findings were well-validated with reference to the past experimental results, in terms of quantitative filling progression and qualitative flow profiles. The volume fraction filled increases monotonically with the filling displacement and thus the filling time. As the underfill fluid advances, the size of the void decreases while the filling efficiency increases. Furthermore, the void formed during the underfilling flow stage was caused by the accelerated contact line jump at the bump entrance. Practical implications The filling progression enabled manufacturers to forecast the underfill flow front, as it advances through the flip-chip. Moreover, filling progression and filling efficiency could provide quantitative insights for the determination of void formations at any filling stages. The voiding formation mechanism enables the prompt formulation of countermeasures. Originality/value Both the filling progression and filling efficiency are new indicative parameters in quantifying the performance of the filling process while considering the reliability defects such as incomplete filling and voiding.

Microstructural and compositional evolution of SAC305/TiN composite solder under thermal stressing

Purpose The purpose of this paper is to investigate the effect of titanium nitride (TiN) on microstructure and composition of 96.5Sn3Ag0.5Cu (SAC305) lead-free solder joints under a large temperature gradient. Design/methodology/approach In this paper, SAC305 lead-free composite solder containing 0.05 Wt.% TiN was prepared by powder metallurgy method. A temperature gradient generator was designed and the corresponding samples were also prepared. The microstructural evolution, internal structure and elemental content of SAC305 and SAC305/TiN solder joints before and after thermal loading were comparatively studied. Findings The experimental results show that the addition of the TiN reinforcing phase can effectively inhibit the diffusion and migration of copper atoms and, therefore, affect the distribution of newly formed Cu-Sn IMC in solder joints under the condition of thermal migration (TM). Compared with the SAC305 solder joint, the interconnection interface and internal structure of the composite solder joint after 600 h of TM are also relatively complete. Originality/value The TiN reinforcing phase is proven effective to mitigate the TM behavior in solder joints under thermal stressing. Specifically, based on the observation and analysis results of microstructure and internal structure of composite solder joint, the TiN particle can change the temperature gradient distribution of the solder joint, so as to suppress the diffusion and migration of Sn and Cu atoms. In addition, the results of Micro-CT and compositional analysis also indicate that the addition of TiN reinforcement is very helpful to maintain the structural integrity and the compositional stability of the solder joint. Different from other ceramic reinforcements, TiN has good thermo- and electro-conductivity and the thermal-electrical performance of composite solder will not be significantly affected by this reinforcement, which is also the main advantage of selecting TiN as the reinforcing phase to prepare composite solder. This study can not only provide preliminary experimental support for the preparation of high reliability lead-free composite solder but also provide a theoretical basis for the subsequent study (such as electro-thermo distribution in solder joints), which has important application significance.

Impact of different aging conditions on the IMC layer growth and shear strength of Ni-modified MWCNTs reinforced Sn-Ag-Cu composite solder

Purpose The purpose of this paper is to develop a new composite solder to improve the reliability of composite solder joints. Nano-particles modified multi-walled carbon nanotubes (Ni-MWCNTs) can indeed improve the microstructure of composite solder joints and improve the reliability of solder joints. Although many people have conducted in-depth research on the composite solder of Ni-MWCNTs. However, no one has studied the performance of Ni-MWCNTs composite solder under different aging conditions. In this article, Ni-MWCNTs was added to Sn-Ag-Cu (SAC) solder, and the physical properties of composite solder, the microstructure and mechanical properties were evaluated. Design/methodology/approach In this study, the effect of different aging conditions on the intermetallic compound (IMC) layer growth and shear strength of Ni-modified MWCNTs reinforced SAC composite solder was studied. Compared with SAC307 solder alloy, the influence of Ni-MWCNTs with different contents (0, 0.1 and 0.2 Wt.%) on composite solder was examined. To study the aging characteristics of composite solder joints, the solder joints were aged at 80°C, 120°C and 150°C. Findings The experimental results show that the content of Ni-MWCNTs affects the morphology and growth of the IMC layer at the interface. The microhardness of the solder increases and the wetting angle decreases. After aging at moderate (120°C) and high temperature (150°C), the morphology of the Cu6Sn5 IMC layer changed from scallop to lamellar and the grain size became coarser. The following two different phase compositions were observed in the solder joints with Ni-MWCNTs reinforcement: Cu3Sn and (Cu, Ni)6Sn5. The fracture surface of the solder joints all appeared ductile dents, and the size of the pits increased significantly with the increase of the aging temperature. Through growth kinetic analysis, Ni-modified MWCNTs in composite solder joints can effectively inhibit the diffusion of atoms in solder joints. In short, when the addition amount of Ni-MWCNTs is 0.1 Wt.%, the solder joints exhibit the best wettability and the highest shear strength. Originality/value In this study, the effects of aging conditions on the growth and shear strength of the IMC layer of Ni modified MWCNTs reinforced SAC307 composite solder were studied. The effects of Ni MWCNTs with different contents (0, 0.1 and 0.2 Wt.%) on the composite solder were examined.

Effects of Sn-Ag-x leveling layers on the microstructure and mechanical properties of SnBi low-temperature solder joints

Purpose The purpose of this paper is to investigate the effects of Sn-Ag-x leveling layers on the mechanical properties of SnBi solder joints. Four Sn-Ag-x (Sn-3.0Ag-0.5Cu, Sn-0.3Ag-0.7Cu, Sn-0.3Ag-0.7Cu-0.5 Bi-0.05Ni and Sn-3.0Ag-3.0 Bi-3.0In) leveling layers were coated on Cu pads to prepare SnBi/Sn-Ag-x/Cu solder joints. The microstructure, hardness, shear strength and fracture morphology of solder joints before and after aging were studied. Design/methodology/approach The interfacial brittleness of the SnBi low-temperature solder joint is a key problem affecting its reliability. The purpose of this study is to improve the mechanical properties of the SnBi solder joint. Findings Owing to the addition of the leveling layers, the grain size of the ß-Sn phase in the SnBi/Sn-Ag-x/Cu solder joint is significantly larger than that in the SnBi/Cu eutectic solder joint. Meanwhile, the hardness of the solder bulk in the SnBi/Cu solder joint shows a decrease trend because of the addition of the leveling layers. The SnBi/Cu solder joint shows obvious strength drop and interfacial brittle fracture after aging. Through the addition of the Sn-Ag-x layers, the brittle failure caused by aging is effectively suppressed. In addition, the Sn-Ag-x leveling layers improve the shear strength of the SnBi/Cu solder joint after aging. Among them, the SnBi/SACBN/Cu solder joint shows the highest shear strength. Originality/value This work suppresses the interfacial brittleness of the SnBi/Cu solder joint after isothermal aging by adding Sn-Ag-x leveling layers on the Cu pads. It provides a way to improve the mechanical performances of the SnBi solder joint.

A study on the effects of electrical and thermal stresses on void formation and migration lifetime of Sn3.0Ag0.5Cu solder joints

Purpose The purpose of this study is to investigate the effect of electrical and thermal stresses on the void formation of the Sn3.0Ag0.5Cu (SAC305) lead-free ball grid array (BGA) solder joints and to propose a modified mean-time-to-failure (MTTF) equation when joints are subjected to coupling stress. Design/methodology/approach The samples of the BGA package were subjected to a migration test at different currents and temperatures. Voltage variation was recorded for analysis. Scanning electron microscope and electron back-scattered diffraction were applied to achieve the micromorphological observations. Additionally, the experimental and simulation results were combined to fit the modified model parameters. Findings Voids appeared at the corner of the cathode. The resistance of the daisy chain increased. Two stages of resistance variation were confirmed. The crystal lattice orientation rotated and became consistent and ordered. Electrical and thermal stresses had an impact on the void formation. As the current density and temperature increased, the void increased. The lifetime of the solder joint decreased as the electrical and thermal stresses increased. A modified MTTF model was proposed and its parameters were confirmed by theoretical derivation and test data fitting. Originality/value This study focuses on the effects of coupling stress on the void formation of the SAC305 BGA solder joint. The microstructure and macroscopic performance were studied to identify the effects of different stresses with the use of a variety of analytical methods. The modified MTTF model was constructed for application to SAC305 BGA solder joints. It was found suitable for larger current densities and larger influences of Joule heating and for the welding ball structure with current crowding.

Design criteria for pad and stencil with high pick-and-Place yield

Purpose This study aims to focus on the passive components of System in Package SiP modules and discusses the geometric pad designs for 01005-sized passive components, the front end design of the hole size and shape of the stencil and the parameters of the stencil sidewall coating, to determine the optimum parameter combination. Design/methodology/approach This study plans and conducts experiments, where a L8(27) inner orthogonal array is built to consider the control factors, including a L4(23) outer orthogonal array to consider the noise factor, and the experimental data are analyzed by using the technique for order preference by similarity to ideal solution multi-quality analysis method. Findings The results show that the optimum design parameter level combination is that the solder mask opening pad has no solder mask in the lower part of the component, the pad width is 1.1 times that of the component width, the pad length is 1.75 times that of the electrode tip length, the pad spacing is 5 mil, the stencil open area is 90% of the pad area, the stencil opening corner has a 3 mil chamfer angle, and the stencil sidewall is free of nano-coating. Originality/value The parameter design and multi-quality analysis method, as proposed in this study, can effectively develop the layout of passive components on a high-density SiP module substrate, to stabilize the process and increase the production yield.

Cu3Sn-microporous copper composite joint for high-temperature die-attach applications

Purpose The purpose of this paper is to design a novel die-attach composite joint for high-temperature die-attach applications based on transient liquid phase bonding. Moreover, the microstructure, shear strength, electrical property, thermal conductivity and aging property of the composite joint were investigated. Design/methodology/approach The composite joint was made of microporous copper and Cu3Sn. Microporous copper was immersed into liquid Sn to achieve Sn-microporous copper composite structure for die attachment. By the thermo-compression bonding, the Cu3Sn-microporous copper composite joint with a thickness of 100 µm was successfully obtained after bonding at 350 °C for 5 min under a low pressure of 0.6 MPa. Findings After thermo-compression bonding, the resulting interconnection could withstand a high temperature of at most 676 °C, with the entire Sn transforming into Cu3Sn with high remelting temperatures. A large shear strength could be achieved with the Cu3Sn-microporous copper in the interconnections. The formed bondlines demonstrated a good electrical and thermal conductivity owing to the large existing amount of copper in the interconnections. Furthermore, the interconnection also exhibited excellent reliability under high temperature aging at 300 °C. Originality/value This die-attach composite joint was suitable for power devices operating under high temperatures or other harsh environments.