High Angular Resolution Studies of Binaries at Georgia State University

AbstractMost massive stars are so distant that their angular diameters are too small for direct resolution. However, the observational situation is now much more favorable, thanks to new opportunities available with optical/IR long-baseline interferometry. The Georgia State University Center for High Angular Resolution Astronomy Array at Mount Wilson Observatory is a six-telescope instrument with a maximum baseline of 330 meters, which is capable of resolving stellar disks with diameters as small as 0.2 milliarcsec. The distant stars are no longer out of range, and many kinds of investigations are possible. Here we summarize a number of studies involving angular diameter measurements and effective temperature estimates for OB stars, binary and multiple stars (including the σ Orionis system), and outflows in Luminous Blue Variables. An enlarged visitors program will begin in 2017 that will open many opportunities for new programs in high angular resolution astronomy.

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INTRODUCTION

Journal of Astronomical Instrumentation ◽

10.1142/s2251171713030013 ◽

2013 ◽

Vol 02 (02) ◽

pp. 1303001 ◽

Cited By ~ 1

Author(s):

T. TEN BRUMMELAAR ◽

P. TUTHILL ◽

G. VAN BELLE

Keyword(s):

Near Infrared ◽

Angular Resolution ◽

The United States ◽

High Angular Resolution ◽

State University ◽

Observational Astronomy ◽

Georgia State University ◽

Infrared Interferometry ◽

Optical Astronomy ◽

Modern Instrumentation

After nearly one and a half centuries of effort, one of the most pernicious problems in observational astronomy — obtaining resolved images of the stars — is finally yielding to advances in modern instrumentation. The exquisite precision delivered by today's interferometric observatories is rapidly being applied to more and more branches of optical astronomy. The most capable interferometers in the Northern Hemisphere, both located in the United States are the Navy Precision Optical Interferometer (NPOI) in Arizona and the Center for High Angular Resolution Astronomy Array (CHARA) run by Georgia State University and located in California. In early 2013 these two groups held a joint meeting hosted by the Lowell Observatory in Flagstaff. All major groups working in the field were represented at this meeting and it was suggested to us by this Journal that this was an excellent opportunity to put together a special issue on interferometry. In order to be as broad as possible, those who did not attend the CHARA/NPOI meeting were also solicited to make a contribution. The result is this collection of papers representing a snap shot of the state of the art of ground based optical and near infrared interferometry.

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Small-Angle Electron Scattering (SAES) of Polymers

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100117467 ◽

1985 ◽

Vol 43 ◽

pp. 78-79

Author(s):

Ralph Oralor ◽

Pamela Lloyd ◽

Satish Kumar ◽

W. W. Adams

Keyword(s):

Electron Scattering ◽

Small Angle ◽

Angular Resolution ◽

Structural Features ◽

Objective Lens ◽

High Angular Resolution ◽

Push Button ◽

First Case ◽

Diffraction Mode ◽

Very High

Small angle electron scattering (SAES) has been used to study structural features of up to several thousand angstroms in polymers, as well as in metals. SAES may be done either in (a) long camera mode by switching off the objective lens current or in (b) selected area diffraction mode. In the first case very high camera lengths (up to 7Ø meters on JEOL 1Ø ØCX) and high angular resolution can be obtained, while in the second case smaller camera lengths (approximately up to 3.6 meters on JEOL 1Ø ØCX) and lower angular resolution is obtainable. We conducted our SAES studies on JEOL 1ØØCX which can be switched to either mode with a push button as a standard feature.

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Large-angle convergent-beam electron-diffraction study of coherent precipitates and decorated dislocations

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100167470 ◽

1996 ◽

Vol 54 ◽

pp. 1002-1004

Author(s):

J.M.K. Wiezorek ◽

H.L. Fraser

Keyword(s):

Electron Diffraction ◽

Angular Resolution ◽

Large Angle ◽

Electron Diffraction Study ◽

Convergent Beam Electron Diffraction ◽

Crystal Defects ◽

High Angular Resolution ◽

Beam Electron ◽

Diffraction Plane ◽

Convergent Beam

Conventional methods of convergent beam electron diffraction (CBED) use a fully converged probe focused on the specimen in the object plane resulting in the formation of a CBED pattern in the diffraction plane. Large angle CBED (LACBED) uses a converged but defocused probe resulting in the formation of ‘shadow images’ of the illuminated sample area in the diffraction plane. Hence, low-spatial resolution image information and high-angular resolution diffraction information are superimposed in LACBED patterns which enables the simultaneous observation of crystal defects and their effect on the diffraction pattern. In recent years LACBED has been used successfully for the investigation of a variety of crystal defects, such as stacking faults, interfaces and dislocations. In this paper the contrast from coherent precipitates and decorated dislocations in LACBED patterns has been investigated. Computer simulated LACBED contrast from decorated dislocations and coherent precipitates is compared with experimental observations.

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