Direct Measurement of the Field Enhancement Caused by Surface Plasmons with the Scanning Tunneling Optical Microscope

1993 ◽  
pp. 281-286 ◽  
Author(s):  
H. Bielefeldt ◽  
B. Hecht ◽  
S. Herminghaus ◽  
J. Mlynek ◽  
O. Marti
Keyword(s):  
Surface Plasmons ◽  
Direct Measurement ◽  
Field Enhancement ◽  
Optical Microscope ◽  
Scanning Tunneling

Scanning Probe Microscopy of Surface Plasmons

1997 ◽  
Vol 11 (21) ◽  
pp. 2465-2510 ◽  
Author(s):  
Igor I. Smolyaninov
Keyword(s):  
Surface Plasmons ◽  
Local Field ◽  
Electromagnetic Waves ◽  
Light Emission ◽  
Near Field ◽  
Field Enhancement ◽  
Weak Localization ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Tunneling Microscopy

Recent development of novel scanning probe techniques such as Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), and Near-Field Optical Microscopy (NFOM) has opened new ways to study local field distribution of surface electromagnetic waves. A lot of experimental efforts have been concentrated on the study of surface plasmons (SP). Different techniques allow to excite and probe SPs with wavelengths from 1 nm down to the optical range along its entire dispersion curve. Large number of phenomena have been studied directly, such as SP scattering by individual defects, strong and weak localization of SP, SP induced local field enhancement, light emission from the tunneling junction, etc. Scanning probe techniques allow not only topography and field mapping but also surface modification and lithography on the nanometer scale. Combination of these features in the same experimental setup proved to be extremely useful in SP studies. For example, some prototype two dimensional optical elements able to control SP propagation have been demonstrated.

Field enhancement and rectification of surface plasmons detected by scanning tunneling microscopy

2011 ◽  
Vol 83 (20) ◽  
Author(s):  
Miklós Lenner ◽  
Péter Rácz ◽  
Péter Dombi ◽  
Győző Farkas ◽  
Norbert Kroó
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Surface Plasmons ◽  
Field Enhancement ◽  
Scanning Tunneling ◽  
Tunneling Microscopy

Scanning-tunneling spectroscopy on conjugated polymer films

2003 ◽  
Vol 771 ◽  
Author(s):  
M. Kemerink ◽  
S.F. Alvarado ◽  
P.M. Koenraad ◽  
R.A.J. Janssen ◽  
H.W.M. Salemink ◽  
...  
Keyword(s):  
Polymer Films ◽  
Conjugated Polymer ◽  
Three Dimensional ◽  
Field Enhancement ◽  
Direct Consequence ◽  
Scanning Tunneling Spectroscopy ◽  
Tunneling Spectroscopy ◽  
Band Alignment ◽  
Scanning Tunneling ◽  
Order Of Magnitude

AbstractScanning-tunneling spectroscopy experiments have been performed on conjugated polymer films and have been compared to a three-dimensional numerical model for charge injection and transport. It is found that field enhancement near the tip apex leads to significant changes in the injected current, which can amount to more than an order of magnitude, and can even change the polarity of the dominant charge carrier. As a direct consequence, the single-particle band gap and band alignment of the organic material can be directly obtained from tip height-voltage (z-V) curves, provided that the tip has a sufficiently sharp apex.

A theoretical model for the Inverse Scanning Tunneling Optical Microscope (ISTOM)

1995 ◽  
Vol 114 (5-6) ◽  
pp. 470-480 ◽  
Author(s):  
D Van Labeke ◽  
F Baida ◽  
D Barchiesi ◽  
D Courjon
Keyword(s):  
Theoretical Model ◽  
Optical Microscope ◽  
Scanning Tunneling

Direct measurement of forces during scanning tunneling microscope imaging of graphite

1989 ◽  
Vol 208 (3) ◽  
pp. A14
Author(s):  
C. Mathew Mate ◽  
Ragnar Erlandsson ◽  
GaryM. McClelland ◽  
Shirley Chiang
Keyword(s):  
Direct Measurement ◽  
Scanning Tunneling Microscope ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Microscope Imaging

Giant optical field enhancement in multi-dielectric stacks by photon scanning tunneling microscopy

2013 ◽  
Vol 103 (13) ◽  
pp. 131102 ◽  
Author(s):  
C. Ndiaye ◽  
M. Zerrad ◽  
A. L. Lereu ◽  
R. Roche ◽  
Ph. Dumas ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Field Enhancement ◽  
Optical Field ◽  
Scanning Tunneling ◽  
Tunneling Microscopy
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