Scanning Probe Microscopy of Surface Plasmons

1997 ◽  
Vol 11 (21) ◽  
pp. 2465-2510 ◽  
Author(s):  
Igor I. Smolyaninov
Keyword(s):  
Surface Plasmons ◽  
Local Field ◽  
Electromagnetic Waves ◽  
Light Emission ◽  
Near Field ◽  
Field Enhancement ◽  
Weak Localization ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Tunneling Microscopy

Recent development of novel scanning probe techniques such as Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), and Near-Field Optical Microscopy (NFOM) has opened new ways to study local field distribution of surface electromagnetic waves. A lot of experimental efforts have been concentrated on the study of surface plasmons (SP). Different techniques allow to excite and probe SPs with wavelengths from 1 nm down to the optical range along its entire dispersion curve. Large number of phenomena have been studied directly, such as SP scattering by individual defects, strong and weak localization of SP, SP induced local field enhancement, light emission from the tunneling junction, etc. Scanning probe techniques allow not only topography and field mapping but also surface modification and lithography on the nanometer scale. Combination of these features in the same experimental setup proved to be extremely useful in SP studies. For example, some prototype two dimensional optical elements able to control SP propagation have been demonstrated.

Scanning Tunneling Microscopy-Induced Light Emission and I(V) Study of Optical Near-Field Properties of Single Plasmonic Nanoantennas

2020 ◽  
pp. 501-507
Author(s):  
Denis V. Lebedev ◽  
Vitaliy A. Shkoldin ◽  
Alexey M. Mozharov ◽  
Dmitry V. Permyakov ◽  
Lilia N. Dvoretckaia ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Light Emission ◽  
Near Field ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Plasmonic Nanoantennas

Field enhancement and rectification of surface plasmons detected by scanning tunneling microscopy

2011 ◽  
Vol 83 (20) ◽  
Author(s):  
Miklós Lenner ◽  
Péter Rácz ◽  
Péter Dombi ◽  
Győző Farkas ◽  
Norbert Kroó
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Surface Plasmons ◽  
Field Enhancement ◽  
Scanning Tunneling ◽  
Tunneling Microscopy

Scanning tunneling microscopy and atomic force microscopy: New tools for biology

1989 ◽  
Vol 47 ◽  
pp. 778-779
Author(s):  
CE Bracker ◽  
P. K. Hansma
Keyword(s):  
Physical Property ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Small Scale ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
New Family ◽  
Small Probe ◽  
Atomic Force ◽  
Transmission Electron

A new family of scanning probe microscopes has emerged that is opening new horizons for investigating the fine structure of matter. The earliest and best known of these instruments is the scanning tunneling microscope (STM). First published in 1982, the STM earned the 1986 Nobel Prize in Physics for two of its inventors, G. Binnig and H. Rohrer. They shared the prize with E. Ruska for his work that had led to the development of the transmission electron microscope half a century earlier. It seems appropriate that the award embodied this particular blend of the old and the new because it demonstrated to the world a long overdue respect for the enormous contributions electron microscopy has made to the understanding of matter, and at the same time it signalled the dawn of a new age in microscopy. What we are seeing is a revolution in microscopy and a redefinition of the concept of a microscope.Several kinds of scanning probe microscopes now exist, and the number is increasing. What they share in common is a small probe that is scanned over the surface of a specimen and measures a physical property on a very small scale, at or near the surface. Scanning probes can measure temperature, magnetic fields, tunneling currents, voltage, force, and ion currents, among others.

SCANNING PROBE MICROSCOPY BASED NANOSCALE PATTERNING AND FABRICATION

COSMOS ◽  
2007 ◽  
Vol 03 (01) ◽  
pp. 1-21 ◽  
Author(s):  
XIAN NING XIE ◽  
HONG JING CHUNG ◽  
ANDREW THYE SHEN WEE
Keyword(s):  
Integrated Circuits ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Nanoscale Patterning ◽  
Atomic Force ◽  
Probe Microscope ◽  
Molecular Manipulation

Nanotechnology is vital to the fabrication of integrated circuits, memory devices, display units, biochips and biosensors. Scanning probe microscope (SPM) has emerged to be a unique tool for materials structuring and patterning with atomic and molecular resolution. SPM includes scanning tunneling microscopy (STM) and atomic force microscopy (AFM). In this chapter, we selectively discuss the atomic and molecular manipulation capabilities of STM nanolithography. As for AFM nanolithography, we focus on those nanopatterning techniques involving water and/or air when operated in ambient. The typical methods, mechanisms and applications of selected SPM nanolithographic techniques in nanoscale structuring and fabrication are reviewed.

scholarly journals Sub-cycle Manipulation of Electrons in a Tunnel Junction with Phase-controlled Single-cycle THz Near-fields

2019 ◽  
Vol 205 ◽  
pp. 08007
Author(s):  
Katsumasa Yoshioka ◽  
Ikufumi Katayama ◽  
Yusuke Arashida ◽  
Atsuhiko Ban ◽  
Yoichi Kawada ◽  
...  
Keyword(s):  
Tunnel Junction ◽  
Phase Shifter ◽  
Electron Tunneling ◽  
Near Field ◽  
Scanning Tunneling ◽  
Electron Dynamics ◽  
Tunneling Microscopy ◽  
Single Cycle ◽  
Carrier Envelope Phase ◽  
Tunneling Dynamics

By utilizing terahertz scanning tunneling microscopy (THz-STM) with a carrier envelope phase shifter for broadband THz pulses, we could successfully control the near-field-mediated electron dynamics in a tunnel junction with sub-cycle precision. Measurements of the phase-resolved sub-cycle electron tunneling dynamics revealed an unexpected large carrier-envelope phase shift between far-field and near-field single-cycle THz waveforms.

Chemical Imaging With a Scanning Probe Microscope

1999 ◽  
Vol 5 (S2) ◽  
pp. 970-971
Author(s):  
Dmitri A. Kossakovski ◽  
John D. Baldeschwieler ◽  
J. L. Beauchamp
Keyword(s):  
Beam Quality ◽  
Near Field ◽  
Ambient Air ◽  
Chemical Imaging ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Visible Range ◽  
Spectrometric Analysis ◽  
Chemical Information ◽  
Near Field Scanning

Scanning Probe Microscopy (SPM) is a superb tool for topographical analysis of samples. However, traditional varieties of SPM such as Atomic Force, Scanning Tunneling and Near-field Scanning Optical Microscopy have limited chemical contrast capability. Recently, several advanced techniques have been reported which provide chemical information in addition to topographical data. All these methods derive advantage from combinations of scanning probe methodologies and some other, chemically sensitive technique. Examples of such approaches are: Near-field Scanning Raman Imaging, Near-field Scanning Infrared Microscopy and mass spectrometric analysis with laser ablation through fiber probes.In this contribution we report the development of a new method in this family of chemically sensitive scanning probe techniques: Laser Induced Breakdown Spectroscopy with Shear Force Microscopy, LIBS-SFM. Traditional LIBS experiments involve focusing a pulsed laser beam onto the sample and observing optical emission from the plasma formed in the ablation area. The emissions are mostly in the UV/visible range, and the signal is due to electronic transitions in excited atoms and ions in the plasma plume. The spectra are analyzed to identify chemical elements. The spatial resolution of LIBS is limited by the wavelength and beam quality of the laser used for ablation. The experiments may be conducted in vacuum, controlled atmosphere, or ambient air.

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