Strain and relaxation in Si-MBE structures studied by reciprocal space mapping using high resolution X-ray diffraction
1995 ◽
Vol 6
(5)
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pp. 292-297
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2015 ◽
Vol 71
(a1)
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pp. s400-s400
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2019 ◽
Vol 64
(4)
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pp. 545-552
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1999 ◽
Vol 201-202
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pp. 868-871
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2008 ◽
Vol 15
(6)
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pp. 549-557
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1997 ◽
Vol 12
(2)
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pp. 541-545
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2014 ◽
Vol 17
(1)
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