Testing of static random access memories by monitoring dynamic power supply current

1992 ◽  
Vol 3 (3) ◽  
pp. 265-278 ◽  
Author(s):  
Shyang-Tai Su ◽  
Rafic Z. Makki
Keyword(s):  
Power Supply ◽  
Random Access ◽  
Dynamic Power ◽  
Static Random Access Memories ◽  
Supply Current ◽  
Dynamic Power Supply Current

scholarly journals Identification of Yield Limiting Defects in a 0.5 Micron, Shallow Trench Isolation Technology

1999 ◽  
Author(s):  
Christopher L. Henderson ◽  
Charles E. Hembree ◽  
Jerry M. Soden ◽  
Thomas J. Headley ◽  
Bruce L. Draper
Keyword(s):  
Power Supply ◽  
Random Access ◽  
Shallow Trench Isolation ◽  
Root Cause ◽  
Trench Isolation ◽  
Static Random Access Memories ◽  
Cause Of Failure ◽  
Radiation Hardened ◽  
Supply Current ◽  
Electrical Analysis

Abstract During the development and qualification of a radiation-hardened, 0.5 μm shallow trench isolation technology, several yield-limiting defects were observed. The 256K (32K x 8) static-random access memories (SRAMs) used as a technology characterization vehicle had elevated power supply current during wafer probe testing. Many of the die sites were functional, but exhibited quiescent power supply current (IDDQ) in excess of 100 μA, the present limit for this particular SRAM. Initial electrical analysis indicated that many of the die sites exhibited unstable IDDQ that fluctuated rapidly. We refer to this condition as “jitter.” The IDDQ jitter appeared to be independent of temperature and predominately associated with the larger 256K SRAMs and not as prevalent in the 16K SRAMs (on the same reticle set). The root cause of failure was found to be two major processing problems: salicide bridging and stress-induced dislocations in the silicon island

scholarly journals Dynamic Power Supply Current Testing for Open Defects in CMOS SRAMs

ETRI Journal ◽  
2001 ◽  
Vol 23 (2) ◽  
pp. 77-84 ◽  
Author(s):  
Doe-Hyun Yoon Yoon ◽  
Hong-Sik Kim Kim ◽  
Sungho Kang Kang
Keyword(s):  
Power Supply ◽  
Dynamic Power ◽  
Current Testing ◽  
Supply Current ◽  
Open Defects ◽  
Dynamic Power Supply Current

A high speed dynamic power supply current sensor

2007 ◽  
Author(s):  
J. Roberts ◽  
A. Eastridge ◽  
D. Binkley ◽  
Scott Thomas ◽  
Rafic Makki
Keyword(s):  
Power Supply ◽  
High Speed ◽  
Current Sensor ◽  
Dynamic Power ◽  
Supply Current ◽  
Dynamic Power Supply Current
Sign in / Sign up

Export Citation Format

Share Document