On-Line Computer Control for the Blast Furnace

JOM ◽  
1965 ◽  
Vol 17 (1) ◽  
pp. 33-39 ◽  
Author(s):  
Claude Staib ◽  
Jean Michard
JOM ◽  
1965 ◽  
Vol 17 (2) ◽  
pp. 165-170 ◽  
Author(s):  
Claude Staib ◽  
Jean Michard

1973 ◽  
Vol 26 (5) ◽  
pp. 661 ◽  
Author(s):  
UJ Schwarz ◽  
DJ Cole ◽  
D Morris

Modifications to the Parkes interferometer are described which allow synthesis observations to be made while still retaining the flexibility of frequent baseline changes. Details are given of the receiver with a phase stabilizing device and its performance, on-line computer control, and data processing. Preliminary observations with a resolution of l' of the two sources PKS 2152-69 and 2356-61 and possible optical identifications are discussed briefly.


1972 ◽  
Vol 16 ◽  
pp. 344-353 ◽  
Author(s):  
Carol J. Kelly ◽  
E. Eichen

AbstractThe system to be described includes hardware and software for the on-line computer control of the X-ray diffraction measurement of residual stress. This determination involves accurately measuring the angles at which a back-reflection line is diffracted, first by diffracting planes parallel to the sample surface, and then by planes at an angle (ψ) to the sample surface. The residual stress is calculated from the difference in the two measured diffraetion angles. The procedure executed by the computer consists of locating the peaks, selecting three angles for collection of X-ray counts, correcting the measured counts, fitting the equi-angular intensity measurements to a three-point parabola, calculating the peak angles, calculating the residual stress from the measured angles and typing a report. This automation has eliminated the tedium of the manual X-ray data accumulation and of the residual stress calculation. The online control has also permitted improvements in the technique not practicable with the manually performed measurement of residual stress.


1997 ◽  
Vol 3 (S2) ◽  
pp. 1171-1172 ◽  
Author(s):  
Ondrej L. Krivanek ◽  
Niklas Dellby ◽  
Andrew J. Spence ◽  
Roger A. Camps ◽  
L. Michael Brown

Aberration correction in electron microscopy is a subject with a 60 year history dating back to the fundamental work of Scherzer. There have been several partial successes, such as Deltrap's spherical aberration (Cs) corrector which nulled Cs over 30 years ago. However, the practical goal of attaining better resolution than the best uncorrected microscope operating at the same voltage remains to be fulfilled. Combining well-known electron-optical principles with stable electronics, versatile computer control, and software able to diagnose and correct aberrations on-line is at last bringing this goal within reach.We are building a quadrupole-octupole Cs corrector with automated aberration diagnosis for a VG HB5 dedicated scanning transmission electron microscope (STEM). A STEM with no spherical aberration will produce a smaller probe size with a given beam current than an uncorrected STEM, and a larger beam current in a given size probe.


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