A critical comparison of on-line coupling IC-ICP-(AES, MS) with competing analytical methods for ultra trace analysis of microelectronic materials

1999 ◽  
Vol 364 (5) ◽  
pp. 404-409 ◽  
Author(s):  
Andreas Seubert
Talanta ◽  
2008 ◽  
Vol 76 (2) ◽  
pp. 382-388 ◽  
Author(s):  
K LEOPOLD ◽  
L HARWARDT ◽  
M SCHUSTER ◽  
G SCHLEMMER

Sign in / Sign up

Export Citation Format

Share Document