Probability-based static wear-leveling algorithm for block and hybrid-mapping NAND flash memory

2012 ◽  
Vol 16 (4) ◽  
pp. 241-264 ◽  
Author(s):  
Yared Hailu Gudeta ◽  
Se Jin Kwon ◽  
Eun-Sun Cho ◽  
Tae-Sun Chung
Author(s):  
Myungsub Lee

In this paper, we propose a block classification with monitor and restriction (BCMR) method to isolate and reduce the interference of blocks in garbage collection and wear leveling. The proposed method monitors the endurance variation of blocks during garbage collection and detects hot blocks by making a restriction condition based on this information. This method induces block classification by its update frequency for garbage collection and wear leveling, resulting in a prolonged lifespan for NAND flash memory systems. The performance evaluation results show that the BCMR method prolonged the life of NAND flash memory systems by 3.95% and reduced the standard deviation per block by 7.4%, on average.


2019 ◽  
Vol 100-101 ◽  
pp. 113433 ◽  
Author(s):  
Debao Wei ◽  
Liyan Qiao ◽  
Xiaoyu Chen ◽  
Mengqi Hao ◽  
Xiyuan Peng

Sign in / Sign up

Export Citation Format

Share Document