A Novel Method for Determination of the Thermal Diffusivity of Thin Films Using a Modulated CO2 Laser

2005 ◽  
Vol 26 (1) ◽  
pp. 203-211 ◽  
Author(s):  
Y. Shimizu ◽  
J. Ishii ◽  
K. Shinzato ◽  
T. Baba
Open Physics ◽  
2010 ◽  
Vol 8 (2) ◽  
Author(s):  
Jerzy Bodzenta ◽  
Anna Kaźmierczak-Bałata ◽  
Jacek Mazur

AbstractInformation on the thermal properties of materials is very important both in fundamental physical research and in engineering applications. The development of materials with desirable heat transport properties requires methods for their experimental determination. In this paper basic concepts of the measurement of parameters describing the heat transport in solids are discussed. Attention is paid to methods utilizing nonstationary temperature fields, especially to photothermal methods in which the temperature disturbance in the investigated sample is generated through light absorption. Exemplary photothermal measuring techniques, which can be realized using common experimental equipment, are described in detail. It is shown that using these techniques it is possible to determine the thermal diffusivity of bulk transparent samples, opaque and semi-transparent plate-form samples, and the thermal conductivity of thin films deposited on thick substrates. Results of the investigation of thermal diffusivity of the ground in the polar region, which is based on the analysis of the propagation of the thermal wave generated by sun-light, are also presented. Based on chosen examples one can state that photothermal techniques can be used for determination of the thermal properties of very different materials.


2011 ◽  
Vol 424 (1) ◽  
pp. 28-35 ◽  
Author(s):  
O. V. Malyshkina ◽  
A. A. Movchikova ◽  
O. N. Kalugina ◽  
A. V. Daineko

2016 ◽  
Vol 87 (8) ◽  
pp. 084903 ◽  
Author(s):  
Deepak Varandani ◽  
Khushboo Agarwal ◽  
Juergen Brugger ◽  
Bodh Raj Mehta

2001 ◽  
Vol 33 (5) ◽  
pp. 517-524
Author(s):  
Eugeny Ivakin ◽  
Liudmila Makarova ◽  
Alexander Rubanov

1991 ◽  
Vol 35 (B) ◽  
pp. 813-818 ◽  
Author(s):  
Kenji Sakurai ◽  
Atsuo Iida

AbstractA novel method using Fourier transform algorithm is proposed to determine each layer thickness of multi-layered thin films from interference oscillation observed in X-ray specular reflection. The peak position in Fourier space gives each layer thickness of the film. The principle of the present technique as well as its applications are described.


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