Nanometer scale crystallographic texture mapping of platinum and lead zirconate titanate thin films by electron backscatter diffraction

Crystallographic orientations of twelve different lead scandium tantalate (PST) ceramics, two lead zirconate titanate ceramics (PZT) and one PZT thin film were investigated by the technique of electron backscatter diffraction (EBSD) in the scanning electron microscope. The PST ceramics were processed under different conditions of temperature and annealing. Crystal orientations in the bulk ceramics were examined and the results were plotted in microtexture pole- and inverse pole-figures. Local texture and misorientation between adjacent grains in certain selected regions of the ceramics were also examined. To compare the results of the PST with another lead-based ferroelectric material, an unpoled and a poled PZT ceramics were studied for their texture. The electrical and electromechanical properties of the PZT ceramics were also measured in an attempt to correlate texture with properties. Extensive studies revealed insignificant texture in the ceramics, indicating no relationship between ferroelectricity and texture. Preferred orientations were observed in a PZT thin film grown by pulsed-laser deposition (PLD) method. Though improved anisotropy in PZT thin films can be attributed to texture, there is no indication of the dependence of piezoelectricity on texture.

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Correlation of electron backscatter diffraction and piezoresponse force microscopy for the nanoscale characterization of ferroelectric domains in polycrystalline lead zirconate titanate

Journal of Applied Physics ◽

10.1063/1.3474940 ◽

2010 ◽

Vol 108 (4) ◽

pp. 042001 ◽

Cited By ~ 12

Author(s):

T. L. Burnett ◽

P. M. Weaver ◽

J. F. Blackburn ◽

M. Stewart ◽

M. G. Cain

Keyword(s):

Lead Zirconate Titanate ◽

Electron Backscatter Diffraction ◽

Piezoresponse Force Microscopy ◽

Lead Zirconate ◽

Force Microscopy ◽

Ferroelectric Domains ◽

Electron Backscatter ◽

Nanoscale Characterization ◽

Backscatter Diffraction

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Failure Mechanisms of Lead Zirconate Titanate Thin Films during Electromechanical Loading

2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF) ◽

10.1109/ifcs-isaf41089.2020.9234833 ◽

2020 ◽

Author(s):

Kathleen Coleman ◽

Julian Walker ◽

Wanlin Zhu ◽

Song Won Ko ◽

Peter Mardilovich ◽

...

Keyword(s):

Thin Films ◽

Lead Zirconate Titanate ◽

Failure Mechanisms ◽

Lead Zirconate ◽

Zirconate Titanate ◽

Electromechanical Loading

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Characteristics of Sputtered Lead Zirconate Titanate Thin Films with Different Layer Configurations and Large Thickness

IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control ◽

10.1109/tuffc.2020.3039230 ◽

2020 ◽

pp. 1-1

Author(s):

Kensuke Kanda ◽

Tsukasa Koyama ◽

Takeshi Yoshimura ◽

Shinichi Murakami ◽

Kazusuke Maenaka

Keyword(s):

Thin Films ◽

Lead Zirconate Titanate ◽

Lead Zirconate ◽

Large Thickness ◽

Zirconate Titanate

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Improvement of Ferroelectric Properties of Lead Zirconate Titanate Thin Films by Ion-substitution using Rare-earth Cations

MRS Proceedings ◽

10.1557/proc-830-d3.3 ◽

2004 ◽

Vol 830 ◽

Author(s):

Hiroshi Nakaki ◽

Hiroshi Uchida ◽

Shoji Okamoto ◽

Shintaro Yokoyama ◽

Hiroshi Funakubo ◽

...

Keyword(s):

Thin Films ◽

Rare Earth ◽

Lead Zirconate Titanate ◽

Ferroelectric Property ◽

Ferroelectric Properties ◽

Lead Zirconate ◽

Crystal Anisotropy ◽

Pzt Film ◽

Zirconate Titanate ◽

Ion Substitution

ABSTRACTRare-earth-substituted tetragonal lead zirconate titanate thin films were synthesized for improving the ferroelectric property of conventional lead zirconate titanate. Thin films of Pb1.00REx (Zr0.40Ti0.60)1-(3x /4)O3 (x = 0.02, RE = Y, Dy, Er and Yb) were deposited on (111)Pt/Ti/SiO2/(100)Si substrates by a chemical solution deposition (CSD). B-site substitution using rare-earth cations described above enhanced the crystal anisotropy, i.e., ratio of PZT lattice parameters c/a. Remanent polarization (Pr) of PZT film was enhanced by Y3+-, Dy3+- and Er3+-substitution from 20 μC/cm2 up to 26, 25 and 26 μC/cm2 respectively, while ion substitution using Yb3+ degraded the Pr value down to 16 μC/cm2. These films had similar coercive fields (Ec) of around 100 kV/cm. Improving the ferroelectric property of PZT film by rare-earth-substitution would be ascribed to the enhancement of the crystal anisotropy. We concluded that ion substitution using some rare-earth cations, such as Y3+, Dy3+ or Er3+, is one of promising technique for improving the ferroelectric property of PZT film.

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