scholarly journals Measuring crystal orientation from etched surfaces via directional reflectance microscopy

2020 ◽  
Vol 55 (25) ◽  
pp. 11669-11678
Author(s):  
Xiaogang Wang ◽  
Shubo Gao ◽  
Ekta Jain ◽  
Bernard Gaskey ◽  
Matteo Seita
Keyword(s):  
Crystal Orientation ◽  
Reflectance Microscopy ◽  
Directional Reflectance

Spherulitic crystal growth in the prodissoconch larval of Crassostrea virginica

1983 ◽  
Vol 41 ◽  
pp. 518-519
Author(s):  
George G. Cocks ◽  
Louis Leibovitz ◽  
DoSuk D. Lee
Keyword(s):  
Crystal Structure ◽  
Crassostrea Virginica ◽  
Crystal Orientation ◽  
Developmental Changes ◽  
Gastrula Stage ◽  
Orthorhombic Crystal ◽  
Orthorhombic Crystal Structure ◽  
Stages Of Growth ◽  
Early Stages ◽  
Initial Deposition

Our understanding of the structure and the formation of inorganic minerals in the bivalve shells has been considerably advanced by the use of electron microscope. However, very little is known about the ultrastructure of valves in the larval stage of the oysters. The present study examines the developmental changes which occur between the time of conception to the early stages of Dissoconch in the Crassostrea virginica(Gmelin), focusing on the initial deposition of inorganic crystals by the oysters.The spawning was induced by elevating the temperature of the seawater where the adult oysters were conditioned. The eggs and sperm were collected separately, then immediately mixed for the fertilizations to occur. Fertilized animals were kept in the incubator where various stages of development were stopped and observed. The detailed analysis of the early stages of growth showed that CaCO3 crystals(aragonite), with orthorhombic crystal structure, are deposited as early as gastrula stage(Figuresla-b). The next stage in development, the prodissoconch, revealed that the crystal orientation is in the form of spherulites.

The Interpretation of Crystal Lattice Images

1972 ◽  
Vol 30 ◽  
pp. 550-551
Author(s):  
J. M. Cowley ◽  
Sumio Iijima
Keyword(s):  
Crystal Orientation ◽  
Diffraction Theory ◽  
Phase Changes ◽  
Electron Wave ◽  
Crystal Lattices ◽  
Heavy Atoms ◽  
Lattice Images ◽  
The Right ◽  
Intuitive Interpretation ◽  
Suitable Approximation

The imaging of detailed structures of crystal lattices with 3 to 4Å resolution, given the correct conditions of microscope defocus and crystal orientation and thickness, has been used by Iijima (this conference) for the study of new types of crystal structures and the defects in known structures associated with fluctuations of stoichiometry. The image intensities may be computed using n-beam dynamical diffraction theory involving several hundred beams (Fejes, this conference). However it is still important to have a suitable approximation to provide an immediate rough estimate of contrast and an evaluation of the intuitive interpretation in terms of an amplitude object.For crystals 100 to 150Å thick containing moderately heavy atoms the phase changes of the electron wave vary by about 10 radians suggesting that the “optimum defocus” theory of amplitude contrast for thin phase objects due to Scherzer and others can not apply, although it does predict the right defocus for optimum imaging.

Infra-Red Reflectance Microscopy (IRRM) for Daisy Chain Flip Chip Device Failure Analysis

2004 ◽  
Author(s):  
Carlo Grilletto ◽  
Steve Hsiung ◽  
Andrew Komrowski ◽  
John Soopikian ◽  
Daniel J.D. Sullivan ◽  
...  
Keyword(s):  
Failure Analysis ◽  
Flip Chip ◽  
State Of The Art ◽  
Failure Mechanisms ◽  
Simple Metal ◽  
X Ray ◽  
Infra Red ◽  
Cause Of Failure ◽  
Reflectance Microscopy ◽  
Ir Emission

Abstract This paper describes a method to "non-destructively" inspect the bump side of an assembled flip-chip test die. The method is used in conjunction with a simple metal-connecting "modified daisy chain" die and makes use of the fact that polished silicon is transparent to infra-red (IR) light. The paper describes the technique, scope of detection and examples of failure mechanisms successfully identified. It includes an example of a shorting anomaly that was not detectable with the state of the art X-ray equipment, but was detected by an IR emission microscope. The anomalies, in many cases, have shown to be the cause of failure. Once this has been accomplished, then a reasonable deprocessing plan can be instituted to proceed with the failure analysis.

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