Temperature dependence of ZnO thin films grown on Si substrate

2007 ◽  
Vol 19 (8-9) ◽  
pp. 749-754 ◽  
Author(s):  
Y. Y. Kim ◽  
C. H. Ahn ◽  
S. W. Kang ◽  
B. H. Kong ◽  
S. K. Mohanta ◽  
...  
2008 ◽  
Vol 254 (16) ◽  
pp. 4956-4960 ◽  
Author(s):  
Xiao-Hong Xu ◽  
Xiu-Fang Qin ◽  
Feng-Xian Jiang ◽  
Xiao-Li Li ◽  
Ya Chen ◽  
...  

2013 ◽  
Vol 200 ◽  
pp. 27-32
Author(s):  
Pawel Popielarski ◽  
Waclaw Bala ◽  
Kazimierz Paprocki

In this work, the dielectric response of ZnO thin films has been studied over a temperature range of 200 K - 550 K. The dielectric response of polycrystalline ZnO thin films in the frequency domain was measured from 42 Hz - to 5 MHz with a small AC signal amplitude at different temperatures. Influence of the light on conductivity has been also investigated. A universal power law relation was brought into picture to explain the frequency dependence of AC conductivity. The temperature dependence of AC conductivity was analyzed in detail. The activation energy obtained from the temperature dependence of AC conductivity was attributed to the shallow trap-controlled space charge conduction in the bulk of the sample.


2012 ◽  
Vol 93 ◽  
pp. 35-38 ◽  
Author(s):  
Ming Hua Tang ◽  
Bo Jiang ◽  
Yong Guang Xiao ◽  
Zheng Qiu Zeng ◽  
Zi Ping Wang ◽  
...  

2007 ◽  
Vol 124-126 ◽  
pp. 135-138 ◽  
Author(s):  
Yumeji Takashige ◽  
Takuya Nebiki ◽  
Tadashi Narusawa

In this study,Wepresent ZnO thin films using electrochemical deposition method. ZnO thin films are deposited onto metal(Cu) and semiconductor (n-type Si) substrates. The electrolyte consists of a 0.1M Zn(NO3)2 solution, and we applied various potentials at different bath temperatures. XRD shows preferential orientation to (002) that increases with the applied cathodic potential and the bath temperature. Similar tendency is shown on both Cu and n-type Si substrates. SEM micrographs show ZnO surface morphology is greatly affected by the applied cathodic potentials. The RBS analysis reflects the rough morphology of ZnO thin film. The composition ratio Zn:O on n-type Si substrate is determined to be 1.0:1.3 ± 0.3 at the cathodic potential of -1.0[V] and the cell temperature of 70.


2004 ◽  
Vol 78 (5) ◽  
pp. 761-764 ◽  
Author(s):  
J.D. Ye ◽  
S.L. Gu ◽  
S.M. Zhu ◽  
F. Qin ◽  
L.Q. Hu ◽  
...  

2008 ◽  
Vol 516 (16) ◽  
pp. 5262-5265 ◽  
Author(s):  
Re-Ching Lin ◽  
Kuo-Sheng Kao ◽  
Chien-Chuan Cheng ◽  
Ying-Chung Chen

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