scholarly journals Effects of organic additives on the microstructural, rheological and electrical properties of silver paste for LTCC applications

Author(s):  
Yongcai Hu ◽  
Zhaofu Du ◽  
Yingbang Yao ◽  
Yue Ma ◽  
Yi Li ◽  
...  
2007 ◽  
Vol 7 (11) ◽  
pp. 3917-3919 ◽  
Author(s):  
Sung Hyun Park ◽  
Dong Seok Seo ◽  
Jong Kook Lee

Recently, PbO containing glass systems in commercial silver paste have been used due to their low glass transition temperature, good thermal and electrical properties. However, PbO is a hazardous material to both health and the environment. In this study, Pb-free silver paste was prepared by mixing commercial silver powder and silver nanoparticles. The commercial powder has an average particle size of 1.6 μm. The silver nanoparticles with particles size of 20–50 nm were synthesized by a chemical reduction method using surfactant. Pb-free frit was added into the mixed silver powder as the amounts of 3, 6 and 9 wt%. Using the obtained paste, thick films were fabricated by a screen printing on alumina substrate and the films were fired at temperature from 400 to 550 °C. The films had thickness of 6–11 μm and sheet resistivity of about 4–11 μΩ cm.


2016 ◽  
Vol 31 (1) ◽  
pp. 311-318 ◽  
Author(s):  
Christian G. Decker ◽  
Michael R. Webb

Effects of organic additives on spectroscopic and electrical properties of a solution-cathode glow discharge are measured. Effects of the discharge on sample solutions with and without additives are measured.


2015 ◽  
Vol 26 (3) ◽  
pp. 907-913 ◽  
Author(s):  
Konrad Kiełbasiński ◽  
Jerzy Szałapak ◽  
Małgorzata Jakubowska ◽  
Anna Młożniak ◽  
Elżbieta Zwierkowska ◽  
...  

Author(s):  
F. M. Ross ◽  
R. Hull ◽  
D. Bahnck ◽  
J. C. Bean ◽  
L. J. Peticolas ◽  
...  

We describe an investigation of the electrical properties of interfacial dislocations in strained layer heterostructures. We have been measuring both the structural and electrical characteristics of strained layer p-n junction diodes simultaneously in a transmission electron microscope, enabling us to correlate changes in the electrical characteristics of a device with the formation of dislocations.The presence of dislocations within an electronic device is known to degrade the device performance. This degradation is of increasing significance in the design and processing of novel strained layer devices which may require layer thicknesses above the critical thickness (hc), where it is energetically favourable for the layers to relax by the formation of misfit dislocations at the strained interfaces. In order to quantify how device performance is affected when relaxation occurs we have therefore been investigating the electrical properties of dislocations at the p-n junction in Si/GeSi diodes.


Author(s):  
A.M. Letsoalo ◽  
M.E. Lee ◽  
E.O. de Neijs

Semiconductor devices require metal contacts for efficient collection of electrical charge. The physics of these metal/semiconductor contacts assumes perfect, abrupt and continuous interfaces between the layers. However, in practice these layers are neither continuous nor abrupt due to poor nucleation conditions and the formation of interfacial layers. The effects of layer thickness, deposition rate and substrate stoichiometry have been previously reported. In this work we will compare the effects of a single deposition technique and multiple depositions on the morphology of indium layers grown on (100) CdTe substrates. The electrical characteristics and specific resistivities of the indium contacts were measured, and their relationships with indium layer morphologies were established.Semi-insulating (100) CdTe samples were cut from Bridgman grown single crystal ingots. The surface of the as-cut slices were mechanically polished using 5μm, 3μm, 1μm and 0,25μm diamond abrasive respectively. This was followed by two minutes immersion in a 5% bromine-methanol solution.


Author(s):  
J.P.S. Hanjra

Tin mono selenide (SnSe) with an energy gap of about 1 eV is a potential material for photovoltaic applications. Various authors have studied the structure, electronic and photoelectronic properties of thin films of SnSe grown by various deposition techniques. However, for practical photovoltaic junctions the electrical properties of SnSe films need improvement. We have carried out investigations into the properties of flash evaporated SnSe films. In this paper we report our results on the structure, which plays a dominant role on the electrical properties of thin films by TEM, SEM, and electron diffraction (ED).Thin films of SnSe were deposited by flash evaporation of SnSe fine powder prepared from high purity Sn and Se, onto glass, mica and KCl substrates in a vacuum of 2Ø micro Torr. A 15% HF + 2Ø% HNO3 solution was used to detach SnSe film from the glass and mica substrates whereas the film deposited on KCl substrate was floated over an ethanol water mixture by dissolution of KCl. The floating films were picked up on the grids for their EM analysis.


Physica ◽  
1954 ◽  
Vol 3 (7-12) ◽  
pp. 834-844 ◽  
Author(s):  
H FRITZSCHE ◽  
K LARKHOROVITZ

Sign in / Sign up

Export Citation Format

Share Document