Applying Total Internal Reflection Excitation and Super Critical Angle Fluorescence Detection to a Morphine Assay

2010 ◽  
Vol 20 (5) ◽  
pp. 1003-1008 ◽  
Author(s):  
Hannu S. Välimäki ◽  
Timo Pulli ◽  
Kirsi Tappura
2012 ◽  
Vol 7 (1-3) ◽  
pp. 45-59 ◽  
Author(s):  
Nam Cao Hoai Le ◽  
Dzung Viet Dao ◽  
Ryuji Yokokawa ◽  
Thien Duy Nguyen ◽  
John C. Wells ◽  
...  

Author(s):  
Douglas Heymann ◽  
Jordan Young ◽  
Ruander Cardenas

Void fraction measurements are used to characterize two-phase flow within a microchannel. Limitations of typical void fraction measurement systems include disruption of the flow (intrusive optical probe) and non-continuous data acquisition. Using the principles of total internal reflection, a Non-Intrusive Void Incidence Sensor (NIVIS) has been developed to determine the void incidence (frequency of a vapor bubble passing a known position in the channel). Continuous data can be recorded with a typical computer. A light beam is introduced through a fiber optic to the outside of a transparent channel wall at a critical angle. This critical angle is designed such that when a vapor bubble is present at the specified location, total internal reflection will occur. An output fiber is fixed in a determined position to receive light in the case of total internal reflection. Without the presence of a vapor bubble, the light beam will be reflected past the output fiber. A substantial increase in output signal is noticed when total internal reflection occurs. Characteristics of the NIVIS, proven during non-intrusive testing, include: continuous data acquisition of bubble incidences, measurements within a 100 micron wide channel, and bubble boundary differentiation.


1972 ◽  
Vol 50 (1) ◽  
pp. 52-56 ◽  
Author(s):  
L. Arthur ◽  
A. Read ◽  
I. R. Dagg ◽  
G. E. Reesor

Microwave phase measurements, using the Robertson homodyne detection method, have been made in the field outside a dielectric prism after microwave energy has experienced total internal reflection. The phase changes that occur in this case are explained by extending Artmann's theory of the Goos-Hänchen effect to microwave optics. Satisfactory agreement between the theory and measurements has been obtained for angles of incidence from 40 to 50° on a dielectric boundary for which the critical angle is 36.4°.


Author(s):  
Nam Cao Hoai Le ◽  
Dzung Viet Dao ◽  
Ryuji Yokokawa ◽  
John C. Wells ◽  
Susumu Sugiyama

2017 ◽  
Vol 23 (5) ◽  
pp. 978-988 ◽  
Author(s):  
Kevin P. Bohannon ◽  
Ronald W. Holz ◽  
Daniel Axelrod

AbstractThe refractive index in the interior of single cells affects the evanescent field depth in quantitative studies using total internal reflection (TIR) fluorescence, but often that index is not well known. We here present method to measure and spatially map the absolute index of refraction in a microscopic sample, by imaging a collimated light beam reflected from the substrate/buffer/cell interference at variable angles of incidence. Above the TIR critical angle (which is a strong function of refractive index), the reflection is 100%, but in the immediate sub-critical angle zone, the reflection intensity is a very strong ascending function of incidence angle. By analyzing the angular position of that edge at each location in the field of view, the local refractive index can be estimated. In addition, by analyzing the steepness of the edge, the distance-to-substrate can be determined. We apply the technique to liquid calibration samples, silica beads, cultured Chinese hamster ovary cells, and primary culture chromaffin cells. The optical technique suffers from decremented lateral resolution, scattering, and interference artifacts. However, it still provides reasonable results for both refractive index (~1.38) and for distance-to-substrate (~150 nm) for the cells, as well as a lateral resolution to about 1 µm.


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