Scanning Seebeck Coefficient Measurement System for Homogeneity Characterization of Bulk and Thin-Film Thermoelectric Materials

2012 ◽  
Vol 41 (6) ◽  
pp. 1667-1674 ◽  
Author(s):  
Shiho Iwanaga ◽  
G. Jeffrey Snyder
Author(s):  
Weihe Xu ◽  
Qi Chen ◽  
Yong Shi ◽  
Hamid Hadim

The P-type perovskite oxides La1-xSrxCoO3 are a promising group of complex oxide thermoelectric (TE) materials because of its a higher Seebeck coefficient. In this paper, the La0.95Sr0.05CoO3 thin film was prepared by spin coating. A custom-made MEMS (micro-electromechanical system) based device was used to measure the voltage output and Seebeck coefficient of the thin film. The measured Seebeck coefficient of the thin film was 350 μV/K.


2018 ◽  
Vol 89 (10) ◽  
pp. 101501 ◽  
Author(s):  
Chen Wang ◽  
Fenggui Chen ◽  
Kuan Sun ◽  
Rui Chen ◽  
Meng Li ◽  
...  

2000 ◽  
Vol 626 ◽  
Author(s):  
Nishant A. Ghelani ◽  
Sim Y. Loo ◽  
Duck-Young Chung ◽  
Sandrine Sportouch ◽  
Stephan de Nardi ◽  
...  

ABSTRACTSeveral new materials in the CsBi4Te6, A2Bi8Se13, (A = K, Rb, Cs), HoNiSb, Ba/Ge/B (B = In, Sn), and AgPbBiQ3 (Q = S, Se, Te) systems have shown promising characteristics for thermoelectric applications. New synthesis techniques are able to produce samples at much higher rates than previously possible. This has led to a persistent challenge in thermoelectric materials research of rapid and comprehensive characterization of samples. This paper presents a description of a new 4-sample transport measurement system and the related measurement techniques. Special features of the system include fully computer-controlled operation (implemented in LabView™) for simultaneous measurement of electrical conductivity, thermo-electric power, and thermal conductivity. This system has been successfully used to characterize several new thermoelectric materials (including some of the above-mentioned compounds) and reference materials exhibiting a wide range of thermal conductivities.


APL Materials ◽  
2015 ◽  
Vol 3 (4) ◽  
pp. 041506 ◽  
Author(s):  
Hyun-Sik Kim ◽  
Zachary M. Gibbs ◽  
Yinglu Tang ◽  
Heng Wang ◽  
G. Jeffrey Snyder

2011 ◽  
Vol 82 (2) ◽  
pp. 024901 ◽  
Author(s):  
Tingting Miao ◽  
Weigang Ma ◽  
Xing Zhang ◽  
Zhen Li

2019 ◽  
Vol 90 (10) ◽  
pp. 104901 ◽  
Author(s):  
Ashish Kumar ◽  
Ashutosh Patel ◽  
Saurabh Singh ◽  
Asokan Kandasami ◽  
D. Kanjilal

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