Scanning Seebeck Coefficient Measurement System for Homogeneity Characterization of Bulk and Thin-Film Thermoelectric Materials
2012 ◽
Vol 41
(6)
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pp. 1667-1674
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Keyword(s):
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2018 ◽
Vol 89
(10)
◽
pp. 101501
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Thermostat for high temperature and transient characterization of thin film thermoelectric materials
2009 ◽
Vol 80
(2)
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pp. 025101
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Keyword(s):
2011 ◽
Vol 82
(2)
◽
pp. 024901
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2019 ◽
Vol 90
(10)
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pp. 104901
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