Effects of Linearity and Reliability Analysis for HGO-DW-SCTFET with Temperature Variation for High Frequency Application

Silicon ◽  
2021 ◽  
Author(s):  
Manshi Kamal ◽  
Dharmendra Singh Yadav
2008 ◽  
Vol 320 (20) ◽  
pp. e963-e966 ◽  
Author(s):  
Yong Zhou ◽  
Zhi-Min Zhou ◽  
Ying Cao ◽  
Xiao-Yu Gao ◽  
Wen Ding

2005 ◽  
Vol 41 (10) ◽  
pp. 3307-3309 ◽  
Author(s):  
Shihui Ge ◽  
Xiaolin Yang ◽  
Kwang Youn Kim ◽  
Li Xi ◽  
Xiaoming Kou ◽  
...  

1993 ◽  
Vol 29 (15) ◽  
pp. 1347
Author(s):  
G. di Cataldo ◽  
G. Palmisano ◽  
G. Palumbo

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