Ionic Liquid Matrix-Enhanced Secondary Ion Mass Spectrometry: The Role of Proton Transfer

2013 ◽  
Vol 24 (3) ◽  
pp. 348-355 ◽  
Author(s):  
Jennifer J. Dertinger ◽  
Amy V. Walker
2003 ◽  
Vol 75 (16) ◽  
pp. 4087-4094 ◽  
Author(s):  
Thomas P. Roddy ◽  
Donald M. Cannon ◽  
Sara G. Ostrowski ◽  
Andrew G. Ewing ◽  
Nicholas Winograd

1991 ◽  
Vol 219 ◽  
Author(s):  
R. Shinar ◽  
X.-L. Wu ◽  
S. Mitra ◽  
J. Shinar

ABSTRACTSecondary ion mass spectrometry and IR studies of long-range hydrogen motion in undoped a-Si:H and a-Ge:H of varying H content and microstructure are reviewed and discussed. In particular, their relation to the multiple trapping (MT) model, the role of microvoids, the significance of the Meyer-Neldel relation (MNR), and the nature of H sites is addressed. It is suggested that while the MT mechanism may be significant in a-Si:H of low H content Cfj, it is largely marginal in films where CH ≥ 10 at.% H and in a-Ge:H. Mono Si-H bonds on microvoid surfaces are apparently deep H trapping sites up to ∼ 400°C, but H is desorbed from such sites in a-Ge:H above 180°C. The MNR between the diffusional activation energy and prefactor is observed among the various a-Si:H and a-Ge:H, but its significance is questionable, and may be due to the MT mechanism only in low H content a-Si:H. The nature of the distribution of H sites is also discussed.


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