scholarly journals Role of ion-ion recombination for alkali chloride cluster formation in liquid secondary ion mass spectrometry

1993 ◽  
Vol 4 (5) ◽  
pp. 410-418 ◽  
Author(s):  
Jan Sunner
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Cluster Formation ◽  
Alkali Chloride ◽  
Ion Mass Spectrometry ◽  
Ion Recombination ◽  
Secondary Ion

Hydrogen Dynamics and Tee Distribution of H Sites in Undoped a-Si:H and a-Ge:H

1991 ◽  
Vol 219 ◽  
Author(s):  
R. Shinar ◽  
X.-L. Wu ◽  
S. Mitra ◽  
J. Shinar
Keyword(s):  
Mass Spectrometry ◽  
Activation Energy ◽  
Long Range ◽  
Secondary Ion Mass Spectrometry ◽  
Ir Studies ◽  
Multiple Trapping ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Trapping Sites

ABSTRACTSecondary ion mass spectrometry and IR studies of long-range hydrogen motion in undoped a-Si:H and a-Ge:H of varying H content and microstructure are reviewed and discussed. In particular, their relation to the multiple trapping (MT) model, the role of microvoids, the significance of the Meyer-Neldel relation (MNR), and the nature of H sites is addressed. It is suggested that while the MT mechanism may be significant in a-Si:H of low H content Cfj, it is largely marginal in films where CH ≥ 10 at.% H and in a-Ge:H. Mono Si-H bonds on microvoid surfaces are apparently deep H trapping sites up to ∼ 400°C, but H is desorbed from such sites in a-Ge:H above 180°C. The MNR between the diffusional activation energy and prefactor is observed among the various a-Si:H and a-Ge:H, but its significance is questionable, and may be due to the MT mechanism only in low H content a-Si:H. The nature of the distribution of H sites is also discussed.

Study of Rubber-Brass Adhesion Mechanism by Secondary Ion Mass Spectrometry

2002 ◽  
Vol 75 (2) ◽  
pp. 199-214 ◽  
Author(s):  
Jong Myoung Kim ◽  
Wim J. van Ooij
Keyword(s):  
Mass Spectrometry ◽  
Copper Sulfide ◽  
Secondary Ion Mass Spectrometry ◽  
Cluster Formation ◽  
Copper Sulfides ◽  
Sulfide Layer ◽  
Tof Sims ◽  
Sulfide Film ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Abstract The sulfidization reaction of brass was studied in a squalene model system by Time-of-Flight Secondary Ion Mass Spectrometry, TOF-SIMS. Fragments of the accelerator were observed on the surface of the brass and their concentration changed with reaction time. Copper sulfide formation in the brass panels was confirmed from the TOF-SIMS spectra. The composition of the brass panels could be studied by varying the analysis depth. TOF-SIMS spectra of copper sulfide layer showed a pattern of cluster formation. Cobalt was observed to exist in the sulfide film partly in combination with carbon. Evidence was found of covalent bonding between copper sulfides and squalene.

scholarly journals Destructive role of oxygen in growth of molybdenum disulfide determined by secondary ion mass spectrometry

2019 ◽  
Vol 21 (17) ◽  
pp. 8837-8842 ◽  
Author(s):  
Paweł Piotr Michałowski ◽  
Piotr Knyps ◽  
Paweł Ciepielewski ◽  
Piotr Caban ◽  
Ewa Dumiszewska ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Molybdenum Disulfide ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Oxygen out-diffusion from substrates containing oxygen leads to the formation of an amorphous MoOS layer in addition to MoS2.

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