Determination of cell membrane passive electrical properties using frequency domain dielectric spectroscopy technique. A new approach

1990 ◽  
Vol 1028 (2) ◽  
pp. 201-204 ◽  
Author(s):  
F. Bordi ◽  
C. Cametti ◽  
A. Di Biasio
2011 ◽  
Vol 127 (1) ◽  
pp. 228-233 ◽  
Author(s):  
Marta Castro-Giráldez ◽  
Laura Dols ◽  
Fidel Toldrá ◽  
Pedro Fito

1981 ◽  
Vol 4 (3) ◽  
pp. 615-623
Author(s):  
Sudhangshu B. Karmakar

This paper illustrates by means of a simple example a new approach for the determination of the time domain response of a class of nonlinear systems. The system under investigation is assumed to be described by a nonlinear differential equation with forcing term. The response of the system is first obtained in terms of the input in the form of a Volterra functional expansion. Each of the components in the expansion is first transformed into a multidimensional frequency domain and then to a single dimensional frequency domain by the technique of association of variables. By taking into consideration the conditions for the rapid convergence of the functional expansion the response of the system in the frequency domain can effectively be obtained by taking only the first few terms of the expansion. Time domain response is then found by inverse Laplace transform.


2010 ◽  
Vol 11 (4) ◽  
pp. 749-754 ◽  
Author(s):  
Marta Castro-Giráldez ◽  
Pedro J. Fito ◽  
Creu Chenoll ◽  
Pedro Fito

2017 ◽  
Vol 30 (1) ◽  
pp. 273-289
Author(s):  
Anmari Meerkotter

The Constitutional Court (CC) judgment of Lee v Minister of Correction Services 2013 2SA 144 (CC) is a recent contribution to transformative constitutional jurisprudence in the field of the law of delict. This matter turned on the issue of factual causation in the context of wrongful and negligent systemic omissions by the state. In this case note, I explore the law relating to this element of delictual liability with specific regard to the traditional test for factual causation – the conditio sine qua non (‘but-for’) test. In particular, I note the problems occasioned by formalistic adherence to this test in the context of systemic state omissions as evidenced by the SCA judgment in the same matter. I also consider the manner in which English courts have addressed this problem. Thereafter, I analyse the CC’s broader approach to the determination of factual causation as one based on common sense and justice. I argue that this approach endorses a break from a formalistic application of the test and constitutes a step towards an approach which resonates with the foundational constitutional values of freedom, dignity and equality. Furthermore, it presents an appropriate solution to the problems associated with factual causation where systemic omissions are concerned. I then consider the transformative impact of the Lee judgment. In particular, I argue that the broader enquiry favoured by the CC facilitates the realisation of constitutionally guaranteed state accountability, and amounts to an extension of the existing norm of accountability jurisprudence. Hence, I contend that the judgment presents a further effort by the Constitutional Court to effect wholesale the constitutionalisation of the law of delict, as well as a vindicatory tool to be used by litigants who have been adversely affected by systemic state omissions.


Author(s):  
Romain Desplats ◽  
Timothee Dargnies ◽  
Jean-Christophe Courrege ◽  
Philippe Perdu ◽  
Jean-Louis Noullet

Abstract Focused Ion Beam (FIB) tools are widely used for Integrated Circuit (IC) debug and repair. With the increasing density of recent semiconductor devices, FIB operations are increasingly challenged, requiring access through 4 or more metal layers to reach a metal line of interest. In some cases, accessibility from the front side, through these metal layers, is so limited that backside FIB operations appear to be the most appropriate approach. The questions to be resolved before starting frontside or backside FIB operations on a device are: 1. Is it do-able, are the metal lines accessible? 2. What is the optimal positioning (e.g. accessing a metal 2 line is much faster and easier than digging down to a metal 6 line)? (for the backside) 3. What risk, time and cost are involved in FIB operations? In this paper, we will present a new approach, which allows the FIB user or designer to calculate the optimal FIB operation for debug and IC repair. It automatically selects the fastest and easiest milling and deposition FIB operations.


Sign in / Sign up

Export Citation Format

Share Document