In situ scanning electron microscope electrical characterization of GaN nanowire nanodiodes using tungsten and tungsten/gallium nanoprobes
2009 ◽
Vol 149
(39-40)
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pp. 1608-1610
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2011 ◽
Vol 6
(2)
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pp. 162-168
2011 ◽
Vol 82
(10)
◽
pp. 106105
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2012 ◽
Vol 399-400
◽
pp. 86-94
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1992 ◽
Vol 3
(1)
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pp. 5-10
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