Surface studies of TiO2SiO2 glasses by X-ray photoelectron spectroscopy

1990 ◽  
Vol 126 (3) ◽  
pp. 202-208 ◽  
Author(s):  
Sharmila M. Mukhopadhayay ◽  
Stephen H. Garofalini
2006 ◽  
Vol 220 (10) ◽  
pp. 1439-1453 ◽  
Author(s):  
J. M. Gottfried ◽  
F. Maier ◽  
J. Rossa ◽  
D. Gerhard ◽  
P. S. Schulz ◽  
...  

1979 ◽  
Vol 50 (11) ◽  
pp. 1386-1390 ◽  
Author(s):  
R. W. Hewitt ◽  
A. T. Shepard ◽  
W. E. Baitinger ◽  
N. Winograd ◽  
W. N. Delgass

1990 ◽  
Vol 04 (13) ◽  
pp. 831-839
Author(s):  
H.C. POON

Intensity data of X-ray photoelectron spectroscopy usually show strong spatial modulations due to diffraction of photoelectrons by the surrounding atoms of the emitter. Some of the theoretical aspects and recent developments in the surface analysis by this diffraction technique will be reviewed.


Author(s):  
Camila Oliveira ◽  
Claudilene Ribeiro Chaves ◽  
Pascal Bargiela ◽  
Maria da Graça Carneiro da Rocha ◽  
Antonio Ferreira da Silva ◽  
...  

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