High resolution time-of-flight low energy ion scattering

2005 ◽  
Vol 230 (1-4) ◽  
pp. 398-401 ◽  
Author(s):  
M. Draxler ◽  
S.N. Markin ◽  
M. Kolíbal ◽  
S. Průša ◽  
T. Šikola ◽  
...  
Keyword(s):  
High Resolution ◽  
Time Of Flight ◽  
Low Energy ◽  
Ion Scattering ◽  
Resolution Time ◽  
Low Energy Ion Scattering

Comparison of a time-of-flight system with an electrostatic analyzer in low-energy ion scattering

1978 ◽  
Vol 149 (1-3) ◽  
pp. 591-594 ◽  
Author(s):  
T.M. Buck ◽  
G.H. Wheatley ◽  
G.L. Miller ◽  
D.A.H. Robinson ◽  
Y.-S. Chen
Keyword(s):  
Time Of Flight ◽  
Low Energy ◽  
Ion Scattering ◽  
Flight System ◽  
Electrostatic Analyzer ◽  
Low Energy Ion Scattering

A combined time-of-flight and electrostatic analyzer for low-energy ion scattering

1999 ◽  
Vol 70 (10) ◽  
pp. 3910-3914 ◽  
Author(s):  
A. W. Denier van der Gon ◽  
M. A. Reijme ◽  
R. F. Rumphorst ◽  
A. J. H. Maas ◽  
H. H. Brongersma
Keyword(s):  
Time Of Flight ◽  
Low Energy ◽  
Ion Scattering ◽  
Electrostatic Analyzer ◽  
Low Energy Ion Scattering

Quantitative analysis of ultra thin layer growth by time-of-flight low energy ion scattering

2008 ◽  
Vol 92 (1) ◽  
pp. 011929 ◽  
Author(s):  
D. Primetzhofer ◽  
S. N. Markin ◽  
P. Zeppenfeld ◽  
P. Bauer ◽  
S. Prusa ◽  
...  
Keyword(s):  
Quantitative Analysis ◽  
Thin Layer ◽  
Time Of Flight ◽  
Layer Growth ◽  
Low Energy ◽  
Ion Scattering ◽  
Low Energy Ion Scattering

High-sensitivity and high-resolution low-energy ion scattering

Vacuum ◽  
2010 ◽  
Vol 84 (8) ◽  
pp. 1005-1007 ◽  
Author(s):  
Hidde H. Brongersma ◽  
Thomas Grehl ◽  
Paul A. van Hal ◽  
Niels C.W. Kuijpers ◽  
Simon G.J. Mathijssen ◽  
...  
Keyword(s):  
High Resolution ◽  
High Sensitivity ◽  
Low Energy ◽  
Ion Scattering ◽  
Low Energy Ion Scattering

scholarly journals Analysis of Thin Films by Time-of-Flight Low Energy Ion Scattering

2007 ◽  
Vol 111 (3) ◽  
pp. 335-341
Author(s):  
S. Průša ◽  
M. Kolíbal ◽  
P. Bábor ◽  
J. Mach ◽  
T. Šikola
Keyword(s):  
Thin Films ◽  
Time Of Flight ◽  
Low Energy ◽  
Ion Scattering ◽  
Low Energy Ion Scattering

A comparison between time-of-flight and stripping cell methods used in low-energy ion scattering

1980 ◽  
Vol 13 (6) ◽  
pp. 665-672 ◽  
Author(s):  
S B Luitjens ◽  
A J Algra ◽  
E P Th M Suurmeijer ◽  
A L Boers
Keyword(s):  
Time Of Flight ◽  
Low Energy ◽  
Ion Scattering ◽  
Low Energy Ion Scattering
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