The nitridation of GaAs and GaN deposition on GaAs examined by in situ time-of-flight low energy ion scattering and RHEED

1996 ◽  
Vol 164 (1-4) ◽  
pp. 185-189 ◽  
Author(s):  
A. Bensaoula ◽  
W.T. Taferner ◽  
E. Kim ◽  
A. Bousetta
Keyword(s):  
Time Of Flight ◽  
Low Energy ◽  
Ion Scattering ◽  
Low Energy Ion Scattering

In situ observations of Ge(001) and Ge/Si(001) using low‐energy ion scattering

1994 ◽  
Vol 12 (6) ◽  
pp. 3012-3017 ◽  
Author(s):  
W. T. Taferner ◽  
A. Freundlich ◽  
A. Bensaoula ◽  
A. Ignatiev ◽  
Kelley Waters ◽  
...  
Keyword(s):  
Low Energy ◽  
Ion Scattering ◽  
Low Energy Ion Scattering ◽  
In Situ Observations

Comparison of a time-of-flight system with an electrostatic analyzer in low-energy ion scattering

1978 ◽  
Vol 149 (1-3) ◽  
pp. 591-594 ◽  
Author(s):  
T.M. Buck ◽  
G.H. Wheatley ◽  
G.L. Miller ◽  
D.A.H. Robinson ◽  
Y.-S. Chen
Keyword(s):  
Time Of Flight ◽  
Low Energy ◽  
Ion Scattering ◽  
Flight System ◽  
Electrostatic Analyzer ◽  
Low Energy Ion Scattering

A combined time-of-flight and electrostatic analyzer for low-energy ion scattering

1999 ◽  
Vol 70 (10) ◽  
pp. 3910-3914 ◽  
Author(s):  
A. W. Denier van der Gon ◽  
M. A. Reijme ◽  
R. F. Rumphorst ◽  
A. J. H. Maas ◽  
H. H. Brongersma
Keyword(s):  
Time Of Flight ◽  
Low Energy ◽  
Ion Scattering ◽  
Electrostatic Analyzer ◽  
Low Energy Ion Scattering

Quantitative analysis of ultra thin layer growth by time-of-flight low energy ion scattering

2008 ◽  
Vol 92 (1) ◽  
pp. 011929 ◽  
Author(s):  
D. Primetzhofer ◽  
S. N. Markin ◽  
P. Zeppenfeld ◽  
P. Bauer ◽  
S. Prusa ◽  
...  
Keyword(s):  
Quantitative Analysis ◽  
Thin Layer ◽  
Time Of Flight ◽  
Layer Growth ◽  
Low Energy ◽  
Ion Scattering ◽  
Low Energy Ion Scattering

In-Situ Measurement ofHe+Stopping in Si Layers by Low-Energy Ion-Scattering Spectroscopy

1996 ◽  
Vol 35 (Part 1, No. 3) ◽  
pp. 1937-1939 ◽  
Author(s):  
Miyako Matsui ◽  
Fumihiko Uchida ◽  
Kiyokazu Nakagawa ◽  
Akio Nishida
Keyword(s):  
Low Energy ◽  
In Situ Measurement ◽  
Ion Scattering ◽  
Low Energy Ion Scattering ◽  
Ion Scattering Spectroscopy

High resolution time-of-flight low energy ion scattering

2005 ◽  
Vol 230 (1-4) ◽  
pp. 398-401 ◽  
Author(s):  
M. Draxler ◽  
S.N. Markin ◽  
M. Kolíbal ◽  
S. Průša ◽  
T. Šikola ◽  
...  
Keyword(s):  
High Resolution ◽  
Time Of Flight ◽  
Low Energy ◽  
Ion Scattering ◽  
Resolution Time ◽  
Low Energy Ion Scattering
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