A comment on ‘the spatial resolution of x-ray microanalysis in the scannning transmission electron microscope’

1982 ◽  
Vol 16 (10) ◽  
pp. 1201-1203 ◽  
Author(s):  
P. Doig ◽  
D. Lonsdale ◽  
P.E.J. Flewitt
Keyword(s):  
Electron Microscope ◽  
Spatial Resolution ◽  
Transmission Electron Microscope ◽  
X Ray ◽  
Transmission Electron

The Spatial Resolution of X-Ray Microanalysis with EDS in the Transmission Electron Microscope

2008 ◽  
Vol 14 (S2) ◽  
pp. 1162-1163 ◽  
Author(s):  
R Gauvin
Keyword(s):  
Electron Microscope ◽  
New Mexico ◽  
Spatial Resolution ◽  
Transmission Electron Microscope ◽  
X Ray ◽  
Transmission Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

X-ray microanalysis of thin specimens in the transmission electron microscope at voltages up to 1000 Kv.

1978 ◽  
Vol 36 (1) ◽  
pp. 540-541
Author(s):  
G. Cliff ◽  
M.J. Nasir ◽  
G.W. Lorimer ◽  
N. Ridley
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Weight Fraction ◽  
Present Series ◽  
Constant Independent ◽  
X Ray ◽  
Transmission Electron ◽  
Series Of Experiments ◽  
Image Position ◽  
X Ray Absorption

In a specimen which is transmission thin to 100 kV electrons - a sample in which X-ray absorption is so insignificant that it can be neglected and where fluorescence effects can generally be ignored (1,2) - a ratio of characteristic X-ray intensities, I1/I2 can be converted into a weight fraction ratio, C1/C2, using the equationwhere k12 is, at a given voltage, a constant independent of composition or thickness, k12 values can be determined experimentally from thin standards (3) or calculated (4,6). Both experimental and calculated k12 values have been obtained for K(11<Z>19),kα(Z>19) and some Lα radiation (3,6) at 100 kV. The object of the present series of experiments was to experimentally determine k12 values at voltages between 200 and 1000 kV and to compare these with calculated values.The experiments were carried out on an AEI-EM7 HVEM fitted with an energy dispersive X-ray detector.

Aspects of microanalysis in a transmission electron microscope

1978 ◽  
Vol 36 (1) ◽  
pp. 510-511
Author(s):  
R. Sinclair ◽  
B.E. Jacobson
Keyword(s):  
Grain Size ◽  
Electron Beam ◽  
Electron Microscope ◽  
Chemical Analysis ◽  
Transmission Electron Microscope ◽  
Vapor Deposition ◽  
Critical Currents ◽  
X Ray ◽  
Fine Grain ◽  
Transmission Electron

INTRODUCTIONThe prospect of performing chemical analysis of thin specimens at any desired level of resolution is particularly appealing to the materials scientist. Commercial TEM-based systems are now available which virtually provide this capability. The purpose of this contribution is to illustrate its application to problems which would have been intractable until recently, pointing out some current limitations.X-RAY ANALYSISIn an attempt to fabricate superconducting materials with high critical currents and temperature, thin Nb3Sn films have been prepared by electron beam vapor deposition [1]. Fine-grain size material is desirable which may be achieved by codeposition with small amounts of Al2O3 . Figure 1 shows the STEM microstructure, with large (∽ 200 Å dia) voids present at the grain boundaries. Higher quality TEM micrographs (e.g. fig. 2) reveal the presence of small voids within the grains which are absent in pure Nb3Sn prepared under identical conditions. The X-ray spectrum from large (∽ lμ dia) or small (∽100 Ǻ dia) areas within the grains indicates only small amounts of A1 (fig.3).

Thickness and composition determinations from T.E.M. specimens using both x-ray and backscattered electron data

1984 ◽  
Vol 42 ◽  
pp. 576-577
Author(s):  
M.D. Ball ◽  
H. Lagace ◽  
M.C. Thornton
Keyword(s):  
Electron Microscope ◽  
Atomic Number ◽  
Transmission Electron Microscope ◽  
Convenient Method ◽  
Flow Chart ◽  
X Ray ◽  
Intensity Measurements ◽  
Transmission Electron ◽  
Electron Intensity ◽  
Backscattered Electron

The backscattered electron coefficient η for transmission electron microscope specimens depends on both the atomic number Z and the thickness t. Hence for specimens of known atomic number, the thickness can be determined from backscattered electron coefficient measurements. This work describes a simple and convenient method of estimating the thickness and the corrected composition of areas of uncertain atomic number by combining x-ray microanalysis and backscattered electron intensity measurements.The method is best described in terms of the flow chart shown In Figure 1. Having selected a feature of interest, x-ray microanalysis data is recorded and used to estimate the composition. At this stage thickness corrections for absorption and fluorescence are not performed.

Luminescent Properties of Gd2MoO6:Eu3+ Nanophosphor for WLEDs

2021 ◽  
Author(s):  
Yan Chen ◽  
Yuemei Lan ◽  
Dong Wang ◽  
Guoxing Zhang ◽  
Wenlong Peng ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Fluorescence Spectra ◽  
Solvothermal Method ◽  
Luminescent Properties ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron

A series of Gd2-xMoO6:xEu3+(x=0.18-0.38) nanophosphors were synthesized by the solvothermal method. The properties of this nanophosphor were characterized by x-ray diffraction (XRD), transmission electron microscope (TEM), fluorescence spectra and diffuse...

Formation of Graphite Encapsulated Nickel Nanoparticles by Ball Milling and Annealing of Expanded Graphite with Nickel

2011 ◽  
Vol 80-81 ◽  
pp. 217-220 ◽  
Author(s):  
Xue Qing Yue ◽  
Hai Jun Fu ◽  
Da Jun Li
Keyword(s):  
Electron Microscope ◽  
Ball Milling ◽  
Transmission Electron Microscope ◽  
Nickel Nanoparticles ◽  
Size Range ◽  
Expanded Graphite ◽  
X Ray Diffraction ◽  
X Ray ◽  
Nickel Powders ◽  
Transmission Electron

Graphite encapsulated nickel nanoparticles were prepared by ball milling andsubsequently annealing a mixture of expanded graphite with nickel powders. The products were characterized by transmission electron microscope and X-ray diffraction. The formation mechanism of the products was discussed. Results show that the products have a size range of 20-150 nm. The graphite and nickel in the products all exhibit a high crystallinity.

Template Induced Synthesis of Nano-Hydroxyapatite by Co-Precipitation Method

2011 ◽  
Vol 311-313 ◽  
pp. 1713-1716 ◽  
Author(s):  
Yan Rong Sun ◽  
Tao Fan ◽  
Chang An Wang ◽  
Li Guo Ma ◽  
Feng Liu
Keyword(s):  
Electron Microscope ◽  
Chondroitin Sulfate ◽  
Aspartic Acid ◽  
Transmission Electron Microscope ◽  
Precipitation Method ◽  
X Ray Diffraction ◽  
X Ray ◽  
Structure And Morphology ◽  
Transmission Electron ◽  
Co Precipitation

Nano-hydroxyapatite with different morphology was synthesized by the co-precipitation method coupled with biomineralization using Ca(NO3)2•4H2O and (NH4)2HPO4 as reagents, adding chondroitin sulfate, agarose and aspartic acid as template. The structure and morphology of the prepared powders were characterized by X-ray diffraction (XRD) and transmission electron microscope (TEM).

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