Analysis of charge-collection efficiency measurements in Schottky diodes
1988 ◽
Vol 31
(11)
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pp. 1587-1594
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Keyword(s):
Keyword(s):
3D imaging of radiation damage in silicon sensor and spatial mapping of charge collection efficiency
2013 ◽
Vol 8
(03)
◽
pp. C03023-C03023
◽
2016 ◽
Vol 55
(4)
◽
pp. 046401
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