Structural analysis of an Si/CoSi2/Si heterostructure using ultrahigh resolution transmission electron microscopy

1986 ◽  
Vol 137 (2) ◽  
pp. 351-361 ◽  
Author(s):  
Cécile d'Anterroches ◽  
François Arnaud d'Avitaya
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Structural Analysis ◽  
Ultrahigh Resolution ◽  
Transmission Electron

Ultrahigh-Resolution Transmission Electron Microscopy at Negative Spherical Aberration

2012 ◽  
pp. 81-107 ◽  
Author(s):  
Knut W. Urban ◽  
Juri Barthel ◽  
Lothar Houben ◽  
Chun-Lin Jia ◽  
Markus Lentzen ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Spherical Aberration ◽  
Ultrahigh Resolution ◽  
Transmission Electron

Structural analysis of carbon nanofiber by transmission electron microscopy and image processing

2002 ◽  
Vol 387 (1) ◽  
pp. 145-150 ◽  
Author(s):  
Kyoichi Oshida ◽  
Kozo Osawa ◽  
Tatsuo Nakazawa ◽  
Yasuo Fukai ◽  
Takuya Hayashi ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Image Processing ◽  
Transmission Electron Microscopy ◽  
Structural Analysis ◽  
Carbon Nanofiber ◽  
Transmission Electron

Structural Analysis of Polysaccharide Networks by Transmission Electron Microscopy: Comparison with Small-Angle X-ray Scattering

2018 ◽  
Vol 19 (3) ◽  
pp. 989-995 ◽  
Author(s):  
Pablo Hernandez-Cerdan ◽  
Bradley W. Mansel ◽  
Andrew Leis ◽  
Leif Lundin ◽  
Martin A.K. Williams
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Structural Analysis ◽  
Small Angle ◽  
X Ray ◽  
X Ray Scattering ◽  
Transmission Electron ◽  
Ray Scattering

Epitaxial Growth on Metal Bonded SiC Substrates: Transmission Electron Microscopy and Photoluminescence

2007 ◽  
Vol 556-557 ◽  
pp. 255-258
Author(s):  
Igor Matko ◽  
Bernard Chenevier ◽  
Jean Marie Bluet ◽  
Roland Madar ◽  
Fabrice Letertre ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Structural Analysis ◽  
Single Crystal ◽  
Epitaxial Growth ◽  
Important Improvement ◽  
Transmission Electron ◽  
Single Crystal Sic

QuaSiC TM substrates can be obtained by transferring a single crystal SiC layer onto a poly SiC substrate using the Smart Cut TM technology. In order to overcome the difficulty of limited thickness, an important improvement has been demonstrated, which consists in obtaining thick SiC structure by growing epitaxial SiC layers on top of transferred layers. The aim of this work is a structural analysis of such layers by Transmission Electron Microscopy and Photoluminescence.

Investigation of Intermetallic Phase Formation and Structural Analysis in Annealed Al/Cu Bilayer Thin Films

2013 ◽  
Vol 845 ◽  
pp. 221-225
Author(s):  
Zulhelmi Alif Abdul Halim ◽  
Muhammad Azizi Mat Yajid ◽  
Zulkifli Mohd Rosli ◽  
Riyaz Ahmad Mohamad Ali
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Structural Analysis ◽  
Annealing Temperature ◽  
Intermetallic Phase ◽  
Intermetallic Phases ◽  
X Ray ◽  
Transmission Electron

The growth of intermetallic phases in Al/Cu bilayers thin film having 2/3 layer thickness ratios were characterized by X-ray powder diffraction (XRD), energy dispersive X-ray (EDX) and transmission electron microscopy (TEM). In annealing temperature of 200 °C, the growth is controlled by Cu diffusion which resulted to formation of θ-Al2Cu, η-AlCu, ζ-Al3Cu4 and γ-Al4Cu9 phase.

Structural analysis of nano structured carbon by transmission electron microscopy and image processing

2013 ◽  
Vol 275 ◽  
pp. 409-412 ◽  
Author(s):  
K. Oshida ◽  
M. Murata ◽  
K. Fujiwara ◽  
T. Itaya ◽  
T. Yanagisawa ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Image Processing ◽  
Transmission Electron Microscopy ◽  
Structural Analysis ◽  
Transmission Electron
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