Ion bombardment induced silicide formation during sputter depth profiling of Ta/Si multilayer thin film structure as studied by x-ray photoelectron spectroscopy and auger electron spectroscopy
2005 ◽
2011 ◽
1991 ◽
Vol 51
(3-4)
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pp. 139-155
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Keyword(s):
1986 ◽
Vol 4
(6)
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pp. 2463-2469
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1987 ◽
Vol 5
(4)
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pp. 1136-1141
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