P-polarized reflectance spectroscopy: A highly sensitive real-time monitoring technique to study surface kinetics under steady state epitaxial deposition conditions
1995 ◽
Vol 13
(1)
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pp. 153-155
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1998 ◽
Vol 183
(3)
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pp. 323-337
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Keyword(s):
1995 ◽
Vol 35
(1-3)
◽
pp. 472-478
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2010 ◽
Vol 9
(1)
◽
pp. 133-140
2011 ◽
Vol 13
(11)
◽
pp. 1209-1212
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2019 ◽
Vol 286
◽
pp. 377-385
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2019 ◽
Vol 7
(17)
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pp. 10456-10463
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Keyword(s):
1997 ◽
Vol 15
(3)
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pp. 807-815
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